System-on-Chip Test Architectures (Record no. 33262)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00452nam a2200157Ia 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 190711s9999 xx 000 0 und d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9780123739735 |
| 082 ## - CLASSIFICATION NUMBER | |
| Call Number | 621.395 W246 |
| 100 ## - AUTHOR NAME | |
| Author | Wang, Laung, Terng. |
| 100 ## - AUTHOR NAME | |
| Author | Stroud, Charles, E. |
| 100 ## - AUTHOR NAME | |
| Author | Touba, Nur, A. |
| 245 #0 - TITLE STATEMENT | |
| Title | System-on-Chip Test Architectures |
| Sub Title | Nanometer Design for Testability |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | Amsterdam |
| Publisher | Elsevier |
| Year of publication | 2008 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | xxxvi+856p.,24X19Cms |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Books |
| 952 ## - LOCATION AND ITEM INFORMATION (KOHA) | |
| -- | DDC |
| 952 ## - LOCATION AND ITEM INFORMATION (KOHA) | |
| -- | DDC |
| 952 ## - LOCATION AND ITEM INFORMATION (KOHA) | |
| -- | DDC |
| Withdrawn status | Lost status | Circulation Status | Permanent Location | Current Location | Entry Date | Source of acquisition | Cost, normal purchase price | Full call number | Accession Number | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|
| | | | CENTRAL LIBRARY | CENTRAL LIBRARY | 2008-02-26 | K.R.E.C. STUDENTS CO-OP SOCIETY | 69.95 | 621.395 W246 | 079047 | Books |
| | | | CENTRAL LIBRARY | CENTRAL LIBRARY | 2008-03-31 | K.R.E.C. STUDENTS CO-OP SOCIETY | 69.95 | 621.395 W246 | 080171 | Books |
| | | | CENTRAL LIBRARY | CENTRAL LIBRARY | 2008-04-29 | K.R.E.C. STUDENTS CO-OP SOCIETY | 69.95 | 621.395 W246 | 080602 | Books |