Piezoelectric Accelerometers with Integral Electronics (Record no. 52844)

000 -LEADER
fixed length control field 03943nam a22005055i 4500
001 - CONTROL NUMBER
control field 978-3-319-08078-9
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20200420221255.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 140806s2015 gw | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9783319080789
-- 978-3-319-08078-9
082 04 - CLASSIFICATION NUMBER
Call Number 621.381
100 1# - AUTHOR NAME
Author Levinzon, Felix.
245 10 - TITLE STATEMENT
Title Piezoelectric Accelerometers with Integral Electronics
300 ## - PHYSICAL DESCRIPTION
Number of Pages XV, 169 p. 99 illus., 37 illus. in color.
505 0# - FORMATTED CONTENTS NOTE
Remark 2 Introduction to Piezoelectric Accelerometers with Integral Electronics -- Piezoelectric Transducers Used for Piezoelectric Accelerometers with Integral Electronics -- Integral FET Amplifiers Used for IEPE Accelerometers -- Noise of a FET Amplifier -- Comparison of 1/f Noise and Thermal Noise in JFETs and MOSFETs -- Fundamental Noise Limit of an IEPE Accelerometer -- Noise of and IEPE Accelerometer -- Ultra-low-noise IEPE Seismic Accelerometers -- High-temperature, up to 175 ºC, Miniature IEPE Accelerometers.
520 ## - SUMMARY, ETC.
Summary, etc This book provides an invaluable reference to Piezoelectric Accelerometers with Integral Electronics (IEPE). It describes the design and performance parameters of IEPE accelerometers and their key elements, PE transducers and FET-input amplifiers. Coverage includes recently designed, low-noise and high temperature IEPE accelerometers. Readers will benefit from the detailed noise analysis of the IEPE accelerometer, which enables estimation of its noise floor and noise limits. Other topics  useful for designers of low-noise, high temperature silicon-based electronics include noise analysis of FET amplifiers, experimental investigation and comparison of low-frequency noise in different JFETs and MOSFETs, and ultra-low-noise JFETs (at level of 0.6 nV/√Hz). The discussion also includes ultra-low-noise (at level of 3 ng/√Hz) seismic IEPE accelerometers and high temperature (up to 175� C) triaxial and single axis miniature IEPE accelerometers, along with key factors for their design. • Provides a comprehensive reference to the design and performance of IEPE accelerometers, including low-noise and high temperature IEPE sensors; • Includes noise analysis of the IEPE accelerometer, which enables estimation of the its noise floor and noise limits; • Describes recently design of ultra-low-noise (at level of 3 ng/√Hz) IEPE seismic accelerometers and high temperature (up to 175� C) triaxial and single axis miniature IEPE accelerometers; • Compares low-frequency noise in different JFETs and MOSFETs including measurement results of ultra-low-noise (at level of 0.6 nV/√Hz) JFET; • Presents key factors for design of low-noise and high temperature IEPE accelerometer and their electronics.
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-3-319-08078-9
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type eBooks
264 #1 -
-- Cham :
-- Springer International Publishing :
-- Imprint: Springer,
-- 2015.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Engineering.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Mechanical engineering.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electronics.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Microelectronics.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electronic circuits.
650 14 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Engineering.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electronics and Microelectronics, Instrumentation.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Circuits and Systems.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Mechanical Engineering.
912 ## -
-- ZDB-2-ENG

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