MEMS and Nanotechnology, Volume 6 (Record no. 58621)

000 -LEADER
fixed length control field 03131nam a22005175i 4500
001 - CONTROL NUMBER
control field 978-1-4614-4436-7
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20200421112547.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 120905s2013 xxu| s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9781461444367
-- 978-1-4614-4436-7
082 04 - CLASSIFICATION NUMBER
Call Number 620.5
245 10 - TITLE STATEMENT
Title MEMS and Nanotechnology, Volume 6
Sub Title Proceedings of the 2012 Annual Conference on Experimental and Applied Mechanics /
300 ## - PHYSICAL DESCRIPTION
Number of Pages VIII, 156 p.
490 1# - SERIES STATEMENT
Series statement Conference Proceedings of the Society for Experimental Mechanics Series,
505 0# - FORMATTED CONTENTS NOTE
Remark 2 From the Contents: Silicon Carbide High Temperature MEMS Capacitive Strain Sensor -- Characterizing External Resistive, Inductive and Capacitive Loads for Micro-switches -- KEYNOTE: Principles Involved in Interpreting Single-Molecule Force Measurement of Biomolecules -- KEYNOTE: Measurement of the Gold-Gold Bond Rupture Force at 4 K in a Single-atom Chain Using Photon-momentum-based Force Calibration -- A Precision Force Microscope for Biophysics -- DNA Molecular Recognition Using AFM Nanometrology -- Hydrodynamic Force Compensation for Single-molecule Mechanical Testing Using Colloidal Probe Atomic Force Microscopy -- New Insight into Pile-Up in Thin Film Indentation.
520 ## - SUMMARY, ETC.
Summary, etc MEMS and Nanotechnology, Volume 6: Proceedings of the 2012 Annual Conference on Experimental and Applied Mechanics, the sixth volume of seven from the Conference, brings together 23 contributions to this important area of research and engineering.  The collection presents early findings and case studies on fundamental and applied aspects of Experimental and Applied Mechanics, including papers on:  Devices & Fabrication Measurement Challenges in Single Molecule/Single Atom Mechanical Testing Nanoindentation Size Effects in Metals Optical Methods Reliability, Residual Stress & Tribology.
700 1# - AUTHOR 2
Author 2 Shaw, Gordon A.
700 1# - AUTHOR 2
Author 2 Prorok, Barton C.
700 1# - AUTHOR 2
Author 2 Starman, LaVern A.
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier http://dx.doi.org/10.1007/978-1-4614-4436-7
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type eBooks
264 #1 -
-- New York, NY :
-- Springer New York :
-- Imprint: Springer,
-- 2013.
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-- txt
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-- computer
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-- rdamedia
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-- online resource
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-- text file
-- PDF
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650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Engineering.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Mechanics.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Mechanics, Applied.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Nanotechnology.
650 14 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Engineering.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Nanotechnology and Microengineering.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Theoretical and Applied Mechanics.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Nanotechnology.
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
-- 2191-5644
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-- ZDB-2-ENG

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