Nonvolatile semiconductor memory technology : (Record no. 59394)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 04571nam a2200973 i 4500 |
| 001 - CONTROL NUMBER | |
| control field | 5263122 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20200421114112.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 100317t20151998nyua ob 001 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9780470545409 |
| -- | electronic |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| -- | |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| -- | electronic |
| 082 04 - CLASSIFICATION NUMBER | |
| Call Number | 621.39/732 |
| 245 00 - TITLE STATEMENT | |
| Title | Nonvolatile semiconductor memory technology : |
| Sub Title | a comprehensive guide to understanding and to using NVSM devices / |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | 1 PDF (xxiii, 589 pages) : |
| 490 1# - SERIES STATEMENT | |
| Series statement | IEEE Press series on microelectronic systems ; |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Remark 2 | Basics of nonvolatile semiconductor memory devices / G. Groeseneken ... [et al.] -- Floating gate planar devices / H.C. Lin and R. Ramaswami -- Floating gate nonplanar devices / H.A.R. Wegener and W. Owen -- Floating gate flash devices / M. Gill and S. Lai -- SONOS nonvolatile semiconductor memories / M.H. White and F.R. Libsch -- Reliability and NVSM reliability / Y. Hsia and V.C. Tyree -- Radiation tolerance / G. Messenger -- Procurement considerations / D. Sweetman. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc | "Complete dependence on semiconductor vendors' application notes and data sheets is now a thing of the past thanks to this all-in-one comparison text on nonvolatile semiconductor memory (NVSM) technology. Working electronics engineers can now refer to this book to access the technical data and applications-focused perspective they need to make intelligent decisions regarding the selection, specification, procurement, and application of NVSM devices. The most comprehensive book in the field, NONVOLATILE SEMICONDUCTOR MEMORY TECHNOLOGY gathers expertly-written information scattered throughout device literature in a single, well-balanced volume. This book features an in-depth overview accompanied by applications-oriented chapters on device reliability and endurance, radiation tolerance, as well as device physics and design. It is an essential reference for electronics engineers." Sponsored by: IEEE Components, Packaging, and Manufacturing Technology Society, IEEE Solid-State Circuits Council/Society. |
| 700 1# - AUTHOR 2 | |
| Author 2 | Brewer, Joe |
| 700 1# - AUTHOR 2 | |
| Author 2 | Brown, William D., |
| 856 42 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263122 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | eBooks |
| 264 #1 - | |
| -- | New York : |
| -- | IEEE Press, |
| -- | c1998. |
| 264 #2 - | |
| -- | [Piscataqay, New Jersey] : |
| -- | IEEE Xplore, |
| -- | [1997] |
| 336 ## - | |
| -- | text |
| -- | rdacontent |
| 337 ## - | |
| -- | electronic |
| -- | isbdmedia |
| 338 ## - | |
| -- | online resource |
| -- | rdacarrier |
| 588 ## - | |
| -- | Description based on PDF viewed 12/21/2015. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Semiconductor storage devices. |
| 695 ## - | |
| -- | Aerospace electronics |
| 695 ## - | |
| -- | Arrays |
| 695 ## - | |
| -- | Belts |
| 695 ## - | |
| -- | Bibliographies |
| 695 ## - | |
| -- | Biographies |
| 695 ## - | |
| -- | Capacitors |
| 695 ## - | |
| -- | Cosmic rays |
| 695 ## - | |
| -- | Dielectrics |
| 695 ## - | |
| -- | EPROM |
| 695 ## - | |
| -- | Electric potential |
| 695 ## - | |
| -- | Electrodes |
| 695 ## - | |
| -- | Failure analysis |
| 695 ## - | |
| -- | Flash memory |
| 695 ## - | |
| -- | History |
| 695 ## - | |
| -- | Indexes |
| 695 ## - | |
| -- | Insulators |
| 695 ## - | |
| -- | Integrated circuit reliability |
| 695 ## - | |
| -- | Integrated circuits |
| 695 ## - | |
| -- | Logic gates |
| 695 ## - | |
| -- | Neutrons |
| 695 ## - | |
| -- | Nonvolatile memory |
| 695 ## - | |
| -- | Orbits |
| 695 ## - | |
| -- | Performance evaluation |
| 695 ## - | |
| -- | Power supplies |
| 695 ## - | |
| -- | Procurement |
| 695 ## - | |
| -- | Programming |
| 695 ## - | |
| -- | Protons |
| 695 ## - | |
| -- | Random access memory |
| 695 ## - | |
| -- | Reliability |
| 695 ## - | |
| -- | Reliability engineering |
| 695 ## - | |
| -- | SONOS devices |
| 695 ## - | |
| -- | Satellites |
| 695 ## - | |
| -- | Semiconductor memory |
| 695 ## - | |
| -- | Silicon |
| 695 ## - | |
| -- | Testing |
| 695 ## - | |
| -- | Timing |
| 695 ## - | |
| -- | Transistors |
| 695 ## - | |
| -- | Tunneling |
No items available.