Central Library

Characterization of high Tc materials and devices by electron microscopy / (Record no. 82256)

000 -LEADER
fixed length control field 03300nam a2200385 i 4500
001 - CONTROL NUMBER
control field CR9780511534829
003 - CONTROL NUMBER IDENTIFIER
control field UkCbUP
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20230516164918.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS
fixed length control field m|||||o||d||||||||
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr||||||||||||
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 090429s2000||||enk o ||1 0|eng|d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780511534829 (ebook)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 9780521554909 (hardback)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 9780521031707 (paperback)
040 ## - CATALOGING SOURCE
Original cataloging agency UkCbUP
Language of cataloging eng
Description conventions rda
Transcribing agency UkCbUP
050 00 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QC611.98.H54
Item number C43 2000
082 00 - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 537.6/23/0284
Edition number 21
245 00 - TITLE STATEMENT
Title Characterization of high Tc materials and devices by electron microscopy /
Statement of responsibility, etc. edited by Nigel D. Browning, Stephen J. Pennycook.
246 3# - VARYING FORM OF TITLE
Title proper/short title Characterization of High Tc Materials & Devices by Electron Microscopy
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture Cambridge :
Name of producer, publisher, distributor, manufacturer Cambridge University Press,
Date of production, publication, distribution, manufacture, or copyright notice 2000.
300 ## - PHYSICAL DESCRIPTION
Extent 1 online resource (xii, 391 pages) :
Other physical details digital, PDF file(s).
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term online resource
Carrier type code cr
Source rdacarrier
500 ## - GENERAL NOTE
General note Title from publisher's bibliographic system (viewed on 05 Oct 2015).
505 00 - FORMATTED CONTENTS NOTE
Miscellaneous information 1.
Title High-resolution transmission electron microscopy /
Statement of responsibility S. Horiuchi and L. He --
Miscellaneous information 2.
Title Holography in the transmission electron microscope /
Statement of responsibility A. Tonomura --
Miscellaneous information 3.
Title Microanalysis by scanning transmission electron microscopy /
Statement of responsibility L.M. Brown and J. Yuan --
Miscellaneous information 4.
Title Specimen preparation for transmission electron microscopy /
Statement of responsibility J.G. Wen --
Miscellaneous information 5.
Title Low-temperature scanning electron microscopy /
Statement of responsibility R.P. Huebener --
Miscellaneous information 6.
Title Scanning tunneling microscopy /
Statement of responsibility M.E. Hawley --
Miscellaneous information 7.
Title Identification of new superconducting compounds by electron microscopy /
Statement of responsibility G. Van Tendeloo and T. Krekels --
Miscellaneous information 8.
Title Valence band electron energy loss spectroscopy (EELS) of oxide superconductors /
Statement of responsibility Y.Y. Wang and V.P. Dravid.
520 ## - SUMMARY, ETC.
Summary, etc. This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element High temperature superconductors.
9 (RLIN) 15900
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Electron microscopy
General subdivision Technique.
9 (RLIN) 68137
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Browning, Nigel D.,
Relator term editor.
9 (RLIN) 68138
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Pennycook, Stephen J.,
Relator term editor.
9 (RLIN) 68139
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Print version:
International Standard Book Number 9780521554909
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1017/CBO9780511534829">https://doi.org/10.1017/CBO9780511534829</a>
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type eBooks

No items available.