Radiation Imaging Detectors Using SOI Technology (Record no. 84975)

000 -LEADER
fixed length control field 03650nam a22006015i 4500
001 - CONTROL NUMBER
control field 978-3-031-02033-9
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20240730163758.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 220601s2017 sz | s |||| 0|eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9783031020339
-- 978-3-031-02033-9
082 04 - CLASSIFICATION NUMBER
Call Number 620
100 1# - AUTHOR NAME
Author Arai, Yasuo.
245 10 - TITLE STATEMENT
Title Radiation Imaging Detectors Using SOI Technology
250 ## - EDITION STATEMENT
Edition statement 1st ed. 2017.
300 ## - PHYSICAL DESCRIPTION
Number of Pages XI, 59 p.
490 1# - SERIES STATEMENT
Series statement Synthesis Lectures on Emerging Engineering Technologies,
505 0# - FORMATTED CONTENTS NOTE
Remark 2 Preface -- Acknowledgments -- Introduction -- Major Issues in SOI Pixel Detector -- Basic SOI Pixel Process -- Radiation Hardness Improvements -- Advanced Process Developments -- Detector Research and Developments -- Summary -- Bibliography -- Authors' Biographies.
520 ## - SUMMARY, ETC.
Summary, etc Silicon-on-Insulator (SOI) technology is widely used in high-performance and low-power semiconductor devices. The SOI wafers have two layers of active silicon (Si), and normally the bottom Si layer is a mere physical structure. The idea of making intelligent pixel detectors by using the bottom Si layer as sensors for X-ray, infrared light, high-energy particles, neutrons, etc. emerged from very early days of the SOI technology. However, there have been several difficult issues with fabricating such detectors and they have not become very popular until recently. This book offers a comprehensive overview of the basic concepts and research issues of SOI radiation image detectors. It introduces basic issues to implement the SOI detector and presents how to solve these issues. It also reveals fundamental techniques, improvement of radiation tolerance, applications, and examples of the detectors. Since the SOI detector has both a thick sensing region and CMOS transistors in amonolithic die, many ideas have emerged to utilize this technology. This book is a good introduction for people who want to develop or use SOI detectors.
700 1# - AUTHOR 2
Author 2 Kurachi, Ikuo.
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier https://doi.org/10.1007/978-3-031-02033-9
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type eBooks
264 #1 -
-- Cham :
-- Springer International Publishing :
-- Imprint: Springer,
-- 2017.
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-- text
-- txt
-- rdacontent
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-- computer
-- c
-- rdamedia
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-- online resource
-- cr
-- rdacarrier
347 ## -
-- text file
-- PDF
-- rda
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Engineering.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electrical engineering.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electronic circuits.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Computers.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Materials science.
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Surfaces (Technology).
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Thin films.
650 14 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Technology and Engineering.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electrical and Electronic Engineering.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Electronic Circuits and Systems.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Computer Hardware.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Materials Science.
650 24 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Surfaces, Interfaces and Thin Film.
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE
-- 2381-1439
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-- ZDB-2-SXSC

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