Theory and methods of photovoltaic material characterization (Record no. 97838)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 02430nmm a2200373 a 4500 |
| 001 - CONTROL NUMBER | |
| control field | 00011179 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20240731095230.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 190306s2019 si a ob 001 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 9789813277137 |
| -- | (ebook) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| -- | (hbk.) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| -- | (hbk.) |
| 082 04 - CLASSIFICATION NUMBER | |
| Call Number | 621.38152 |
| 100 1# - AUTHOR NAME | |
| Author | Ahrenkiel, Richard K. |
| 245 10 - TITLE STATEMENT | |
| Title | Theory and methods of photovoltaic material characterization |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | Singapore : |
| Publisher | World Scientific Publishing Co. Pte Ltd., |
| Year of publication | ©2019. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Number of Pages | 1 online resource (324 p.) : |
| 490 0# - SERIES STATEMENT | |
| Series statement | Materials and energy ; |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Remark 2 | Semiconductor fundamentals -- Optical absorption and radiation -- Recombination -- Carrier diffusion and confinement -- Planar device analysis -- Transient photoconductivity -- Time resolved photoluminescence -- Auger recombination -- Trapping spectroscopy -- Steady state techniques -- Free carrier absorption -- Charge separation effects -- Self absorption and photon recycling -- Dual sensor techniques. |
| 520 ## - SUMMARY, ETC. | |
| Summary, etc | "This book provides an extensive review of the theory of transport and recombination properties in semiconductors. The emphasis is placed on electrical and optical techniques. There is a presentation of the latest experimental and theoretical techniques used to analyze minority-carrier lifetime. The relevant hardware and instrumentation are described. The newest techniques of lifetime mapping are presented. The issues are discussed relating to effects that mask carrier lifetime in certain device structures. The discrepancy between photoconductive and photoluminescence measurement results are analyzed."-- |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| General subdivision | Transportation. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| General subdivision | Recombination. |
| 700 1# - AUTHOR 2 | |
| Author 2 | Ahrenkiel, S. Phil. |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | https://www.worldscientific.com/worldscibooks/10.1142/11179#t=toc |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | eBooks |
| 588 ## - | |
| -- | Title from web page (viewed March 6, 2019). |
| 520 ## - SUMMARY, ETC. | |
| -- | Publisher's website. |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Semiconductors |
| 650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1 | |
| -- | Semiconductors |
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