LSI/VLSI TESTABILITY DESIGN
By: TSUI,F.F.
Material type: BookPublisher: NEW YORK McGraw-Hill 1987Description: 22X15.ISBN: 0070653410.DDC classification: 621.38175 T877Item type | Current location | Call number | Status | Date due | Barcode |
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Books | CENTRAL LIBRARY | 621.38175 T877 (Browse shelf) | Available | 052131 | |
Books | CENTRAL LIBRARY | 621.38175 T877 (Browse shelf) | Available | 052949 |
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621.38175 T739 TOWERS INTERNATIONAL OP AMP LINEAR IC SELECTOR | 621.38175 T7688 EXPERIMENTER'S GUIDE TO INTEGRATED CIRCUITS | 621.38175 T7688 EXPERIMENTER'S GUIDE TO INTEGRATED CIRCUITS | 621.38175 T877 LSI/VLSI TESTABILITY DESIGN | 621.38175 T877 LSI/VLSI TESTABILITY DESIGN | 621.38175 U973 FUNDAMENTALS OF MOS DIGITAL INTEGRATED CIRCUITS | 621.38175 U973 CMOS LOGIC CIRCUIT DESIGN |
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