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Unified Methods for VLSI Simulation and Test Generation

By: Cheng, Kwang, Ting | Agrawal, Vishwani, D.
Material type: materialTypeLabelBookPublisher: Boston Kluwer Academic 1989Description: xii+148p.,24X16Cms.ISBN: 0792390253.DDC classification: 621.395 C518
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621.395 C518 (Browse shelf) Available 076322

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