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PHYSICAL PRINCIPLES OF ELECTRON MICROSCOPY:INTRODUCTION TO TEM,SEM AND AEM

By: EGERTON,R.F.
Material type: materialTypeLabelBookPublisher: NEW YORK Springer 2007Description: xii+202p.,22x18Cms.ISBN: 0387258003.DDC classification: 669.950282 E29
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669.950282 E29 (Browse shelf) Available 079562

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