SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS
By: GOLDSTEIN, JOSEPH.&et...al.
Material type:
BookPublisher: NEW YORK Springer 2003Description: xix+690p.;26X18Cms.ISBN: 0306472923.DDC classification: 669.950282 G622
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
Books
|
CENTRAL LIBRARY | 669.950282 G622 (Browse shelf) | Available | 102445 |
Browsing CENTRAL LIBRARY Shelves Close shelf browser
|
|
No cover image available | No cover image available | No cover image available | No cover image available | No cover image available | ||
| 669.950282 F974 TRANSMISSION ELECTRON MICROSCOPY AND DIFFRACTOMETRY OF MATERIALS | 669.950282 F974 TRANSMISSION ELECTRON MICROSCOPY AND DIFFRACTOMETRY OF MATERIALS | 669.950282 G456 OPTICAL MICROSCOPY OF METALS | 669.950282 G622 SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS | 669.950282 G635 MICROSCOPIC METHODS IN METALS | 669.950282 G787 PRACTICAL MICROSCOPICAL METALLOGRAPHY | 669.950282 G787 PRACTICAL MICROSCOPICAL METALLOGRAPHY |
There are no comments for this item.