Linear Systems [electronic resource] : A Measurement Based Approach / by S. P. Bhattacharyya, L.H. Keel, D.N. Mohsenizadeh.
By: Bhattacharyya, S. P [author.].
Contributor(s): Keel, L.H [author.] | Mohsenizadeh, D.N [author.] | SpringerLink (Online service).
Material type: BookSeries: SpringerBriefs in Applied Sciences and Technology: Publisher: New Delhi : Springer India : Imprint: Springer, 2014Description: X, 89 p. 45 illus. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9788132216414.Subject(s): Engineering | System theory | Control engineering | Electronic circuits | Engineering | Control | Systems Theory, Control | Circuits and SystemsAdditional physical formats: Printed edition:: No titleDDC classification: 629.8 Online resources: Click here to access onlineLinear Equations with Parameters -- Application to DC Circuits -- Application to AC Circuits -- Application to Mechanical Systems -- Application to Control Systems -- References.
This brief presents recent results obtained on the analysis, synthesis and design of systems described by linear equations. It is well known that linear equations arise in most branches of science and engineering as well as social, biological and economic systems. The novelty of this approach is that no models of the system are assumed to be available, nor are they required. Instead, a few measurements made on the system can be processed strategically to directly extract design values that meet specifications without constructing a model of the system, implicitly or explicitly. These new concepts are illustrated by applying them to linear DC and AC circuits, mechanical, civil and hydraulic systems, signal flow block diagrams and control systems. These applications are preliminary and suggest many open problems. The results presented in this brief are the latest effort in this direction and the authors hope these will lead to attractive alternatives to model-based design of engineering and other systems.
There are no comments for this item.