Surface Analysis with STM and AFM Experimental and Theoretical Aspects of Image Analysis
By: Magonov, Sergei N
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Material type: 
BookPublisher: Germany VCH 1996Description: p.323.ISBN: 3527293132.Subject(s): Electron Transport Process | Bias Voltage | Tapping Mode | Poly filmsDDC classification: 502.82 M27S
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CENTRAL LIBRARY | 502.82 M27S (Browse shelf) | Available | G00782 | |
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Donated Books
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CENTRAL LIBRARY | 502.82 M27S (Browse shelf) | Available | G00783 |
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| 502.07 W373 MORE RANDOM WALK IN SCIENCE | 502.40954 J254 SCIENCE AND SCIENTISTS IN INDIA (VEDIC TO MODERN) | 502.8 R681 INTRODUCTION TO MICROSCOPY BY MEANS OF LIGHT, ELECTRONS, X-RAYS, OR ULTRASOUND | 502.82 M27S Surface Analysis with STM and AFM | 502.82 M27S Surface Analysis with STM and AFM | 502.82 M978 FUNDAMENTALS OF LIGHT - MICROSCOPY AND ELECTRONIC IMAGING | 502.8203 H437 DICTIONARY OF MICROSCOPY |
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