Testing for small-delay defects in nanoscale CMOS integrated circuits / edited by Sandeep K. Goel, Krishnendu Chakrabarty.
Contributor(s): Goel, Sandeep K [editor of compilation.]
| Chakrabarty, Krishnendu [editor of compilation.].
Material type: 
BookSeries: Devices, circuits, and systems: Publisher: Boca Raton : CRC Press, 2014Description: 1 online resource.ISBN: 9781315217819; 9781351825016; 9781439829424.Subject(s): Metal oxide semiconductors, Complementary -- TestingAdditional physical formats: Print version: : No titleDDC classification: 621.39732 Online resources: Click here to view.
Contents:
section 1. Timing-aware ATPG -- section 2. Faster-than-at-speed -- section 3. Alternative methods -- section 4. SDD metrics.
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section 1. Timing-aware ATPG -- section 2. Faster-than-at-speed -- section 3. Alternative methods -- section 4. SDD metrics.
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