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Thermal Conductivity Measurements in Atomically Thin Materials and Devices [electronic resource] / by T. Serkan Kasirga.

By: Kasirga, T. Serkan [author.].
Contributor(s): SpringerLink (Online service).
Material type: materialTypeLabelBookSeries: Nanoscience and Nanotechnology: Publisher: Singapore : Springer Nature Singapore : Imprint: Springer, 2020Edition: 1st ed. 2020.Description: XV, 50 p. 24 illus., 21 illus. in color. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9789811553486.Subject(s): Nanoscience | Optical materials | Thermodynamics | Heat engineering | Heat transfer | Mass transfer | Surfaces (Physics) | Condensed matter | Surfaces (Technology) | Thin films | Nanophysics | Optical Materials | Engineering Thermodynamics, Heat and Mass Transfer | Surface and Interface and Thin Film | Condensed Matter Physics | Surfaces, Interfaces and Thin FilmAdditional physical formats: Printed edition:: No title; Printed edition:: No titleDDC classification: 530.41 | 620.115 Online resources: Click here to access online
Contents:
Introduction -- Importance of thermal management in modern applications -- Thermal properties of atomically thin materials and devices -- Thermal conductivity measurement methods for nanosheets -- Steady-state measurement methods -- Transient measurement methods -- Use of photothermal effects as a novel thermal conductivity measurement method -- Outlook.
In: Springer Nature eBookSummary: This book assesses the thermal feasibility of using materials with atomically thin layers such as graphene and the transition metal dichalcogenides family in electronics and optoelectronics applications. The focus is on thermal conductivity measurement techniques currently available for the investigation of thermal performance at the material and device level. In addition to providing detailed information on the available techniques, the book introduces readers to novel techniques based on photothermal effects. .
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Introduction -- Importance of thermal management in modern applications -- Thermal properties of atomically thin materials and devices -- Thermal conductivity measurement methods for nanosheets -- Steady-state measurement methods -- Transient measurement methods -- Use of photothermal effects as a novel thermal conductivity measurement method -- Outlook.

This book assesses the thermal feasibility of using materials with atomically thin layers such as graphene and the transition metal dichalcogenides family in electronics and optoelectronics applications. The focus is on thermal conductivity measurement techniques currently available for the investigation of thermal performance at the material and device level. In addition to providing detailed information on the available techniques, the book introduces readers to novel techniques based on photothermal effects. .

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