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Pattern Recognition and Artificial Intelligence [electronic resource] : Third International Conference, ICPRAI 2022, Paris, France, June 1-3, 2022, Proceedings, Part I / edited by Mounîm El Yacoubi, Eric Granger, Pong Chi Yuen, Umapada Pal, Nicole Vincent.

Contributor(s): El Yacoubi, Mounîm [editor.] | Granger, Eric [editor.] | Yuen, Pong Chi [editor.] | Pal, Umapada [editor.] | Vincent, Nicole [editor.] | SpringerLink (Online service).
Material type: materialTypeLabelBookSeries: Lecture Notes in Computer Science: 13363Publisher: Cham : Springer International Publishing : Imprint: Springer, 2022Edition: 1st ed. 2022.Description: XXIII, 704 p. 298 illus., 252 illus. in color. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9783031090370.Subject(s): Image processing -- Digital techniques | Computer vision | Computer Imaging, Vision, Pattern Recognition and GraphicsAdditional physical formats: Printed edition:: No title; Printed edition:: No titleDDC classification: 006 Online resources: Click here to access online In: Springer Nature eBookSummary: This two-volume set constitutes the proceedings of the Third International Conference on Pattern Recognition and Artificial Intelligence, ICPRAI 2022, which took place in Paris, France, in June 2022. The 98 full papers presented were carefully reviewed and selected from 192 submissions. The papers present new advances in the field of pattern recognition and artificial intelligence. They are organized in topical sections as follows: pattern recognition; computer vision; artificial intelligence; big data.
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This two-volume set constitutes the proceedings of the Third International Conference on Pattern Recognition and Artificial Intelligence, ICPRAI 2022, which took place in Paris, France, in June 2022. The 98 full papers presented were carefully reviewed and selected from 192 submissions. The papers present new advances in the field of pattern recognition and artificial intelligence. They are organized in topical sections as follows: pattern recognition; computer vision; artificial intelligence; big data.

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