SUN, Y. <br/><br/>
TEST AND DIAGNOSIS OF ANALOGUE, MIXED-SIGNAL AND RF INTEGRATED CIRCUIT 

 - LONDON  IET  2012 
 - xx+389p.;23x15Cms. 
<br/><br/><label>ISBN: </label>978086341745 
<br/><br/><label>Dewey Class. No.: </label>621.3815 S9484