REIMER, L. <br/><br/>
SCANNING ELECTRON MICROSCOPY: PHYSICS OF IMAGE FORMATION AND MICROANALYSIS 

 - NEW YORK  Springer  1998 
 - xiv+527p.,24x16Cms. 
<br/><br/><label>ISBN: </label>3540639763 
<br/><br/><label>Dewey Class. No.: </label>502.825 R363