Testing for small-delay defects in nanoscale CMOS integrated circuits / 
edited by Sandeep K. Goel, Krishnendu Chakrabarty. 
 - 1 online resource 
 - Devices, circuits, and systems .
 - Devices, circuits, and systems. .
<br/><br/>section 1. Timing-aware ATPG -- section 2. Faster-than-at-speed -- section 3. Alternative methods -- section 4. SDD metrics. 
<br/><br/><label>ISBN: </label>9781315217819 9781351825016 9781439829424 
<br/><br/><label>Standard No.: </label>10.1201/b15549   doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal oxide semiconductors, Complementary--Testing.
<br/><br/><label>LC Class. No.: </label>TK7871.99.M44  / T43 2014 
<br/><br/><label>Dewey Class. No.: </label>621.39732  / T344