Abramovici, Miron, <br/><br/>
Digital systems testing and testable design / 
Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman. 
 - 1 PDF (xxi, 653 pages) :  illustrations. 
 - Electrical engineering, communications, and signal processing .
 - Electrical engineering, communications, and signal processing .
<br/><br/>Includes bibliographical references (p. 644-645) and index. 
<br/><br/>Preface. How This Book Was Written. Introduction. Modeling. Logic Simulation. Fault Modeling. Fault Simulation. Testing For Single Stuck Faults. Testing For Bridging Faults. Functional Testing. Design For Testability. Compression Techniques. Built-In Self-Test. Logic-Level Diagnosis. Self-Checking Design. PLA Testing. System-Level Diagnosis. Index. 
<br/><br/> Restricted to subscribers or individual electronic text purchasers. 
<br/><br/> This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field. 
<br/><br/>
<br/><br/><br/>Mode of access: World Wide Web 
<br/><br/><label>ISBN: </label>9780470544389 
<br/><br/><label>Standard No.: </label>10.1109/9780470544389  doi 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital integrated circuits--Testing.<br/>Digital integrated circuits--Design and construction.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>TK7874  / .A23 1990eb 
<br/><br/><label>Dewey Class. No.: </label>621.381/5