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Model Validation and Uncertainty Quantification, Volume 3 [electronic resource] : Proceedings of the 33rd IMAC, A Conference and Exposition on Structural Dynamics, 2015 / edited by H. Sezer Atamturktur, Babak Moaveni, Costas Papadimitriou, Tyler Schoenherr.
by Atamturktur, H. Sezer [editor.] | Moaveni, Babak [editor.] | Papadimitriou, Costas [editor.] | Schoenherr, Tyler [editor.] | SpringerLink (Online service). Source: Springer eBooksMaterial type:  Book; Format:
electronic
available online
 ; Literary form:
Not fiction
Publisher: Cham : Springer International Publishing : Imprint: Springer, 2015Online access: Click here to access online Availability: No items available
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Doubt-Free Uncertainty In Measurement [electronic resource] : An Introduction for Engineers and Students / by Colin Ratcliffe, Bridget Ratcliffe.
by Ratcliffe, Colin [author.] | Ratcliffe, Bridget [author.] | SpringerLink (Online service). Source: Springer eBooksMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Cham : Springer International Publishing : Imprint: Springer, 2015Online access: Click here to access online Availability: No items available
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Accelerated stress testing handbook : guide for achieving quality products / edited by H. Anthony Chan, Paul J. Englert.
by Chan, H. Anthony, 1952- | Englert, Paul J, 1960- | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: New York : IEEE Press, c2001Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2009]Online access: Abstract with links to resource Availability: No items available
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Modeling for reliability analysis : Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems / Jan Pukite, Paul Pukite.
by Pukite, Jan, 1928- | Pukite, Paul | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: New York : IEEE Press, c1998Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1998]Online access: Abstract with links to resource Availability: No items available
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Risk assessment of power systems : models, methods, and applications / Wenyuan Li.
by Li, Wenyuan [author.] | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.]. Material type: Book; Format:
available online
Publisher: Piscataway, New Jersey : IEEE Press, c2005Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2005]Online access: Abstract with links to resource Availability: No items available
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Digital communication over fading channels / Marvin K. Simon, Mohamed-Slim Alouini.
by Simon, Marvin Kenneth, 1939- | Alouini, Mohamed-Slim | IEEE Xplore (Online Service) [distributor.] | John Wiley & Sons [publisher.]. Edition: 2nd ed.Material type: Book; Format:
available online
Publisher: Hoboken, New Jersey : John Wiley & Sons, c2005Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2005]Online access: Abstract with links to resource Availability: No items available
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Maintaining mission critical systems in a 24/7 environment / Peter M. Curtis.
by Curtis, Peter M [author.] | IEEE Xplore (Online service) [distributor.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Hoboken, New Jersey : Wiley, c 2007Online access: Abstract with links to resource Availability: No items available
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Dependability benchmarking for computer systems / edited by Karama Kanoun, Lisa Spainhower.
by Kanoun, Karama | Spainhower, Lisa | IEEE Xplore (Online Service) [distributor.] | John Wiley & Sons [publisher.]. Material type: Book; Format:
available online
Publisher: Hoboken, New Jersey : Wiley, c2008Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2008]Online access: Abstract with links to resource Availability: No items available
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Trustworthy systems through quantitative software engineering / Lawrence Bernstein, Christine M. Yuhas.
by Bernstein, Lawrence, 1940- | Yuhas, C. M | IEEE Xplore (Online Service) [distributor.] | Wiley InterScience (Online service) [publisher.]. Material type: Book; Format:
available online
Publisher: Hoboken, New Jersey : Wiley, c2005Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2005]Online access: Abstract with links to resource Availability: No items available
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Tutorial on hardware and software reliability, maintainability, and availability / Norman Schneidewind.
by Schneidewind, Norman [author.] | IEEE Xplore (Online service) [distributor.]. Material type: Book; Format:
available online
Publisher: New York : Standards Information Network IEEE Press, c2008Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2008]Online access: Abstract with links to resource Availability: No items available
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Systems and software engineering with applications / Norman F. Schneidewind.
by Schneidewind, Norman [author.] | IEEE Xplore (Online Service) [distributor.] | Wiley InterScience (Online service) [publisher.]. Material type: Book; Format:
available online
Publisher: New York, NY : Institute of Electrical and Electronics Engineers, 2009Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2009]Online access: Abstract with links to resource Availability: No items available
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Design for reliability : information and computer-based systems / Eric Bauer.
by Bauer, Eric [author.] | John Wiley & Sons [publisher.] | IEEE Xplore [distributor.]. Material type: Book; Format:
available online
Publisher: Hoboken, New Jersey : Wiley-IEEE Press, c2010Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2011]Online access: Abstract with links to resource Availability: No items available
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Transient-induced latchup in CMOS integrated circuits / Ming-Dou Ker and Sheng-Fu Hsu.
by Ker, Ming-Dou [author.] | Hsu, Sheng-Fu | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.]. Material type: Book; Format:
available online
Publisher: Singapore ; Wiley, c2009Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2010]Online access: Abstract with links to resource Availability: No items available
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Power distribution system reliability : practical methods and applications / Ali A. Chowdhury, Don O. Koval.
by Chowdhury, Ali A [author.] | Koval, D. O. (Don Orest) | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Hoboken [New Jersey] : John Wiley & Sons, c2009Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2009]Online access: Abstract with links to resource Availability: No items available
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Practical system reliability / Eric Bauer, Xuemei Zhang, Douglas A. Kimber.
by Bauer, Eric [author.] | Zhang, Xuemei [aut ] | Kimber, Douglas A [aut ] | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Piscataway, New Jersey : IEEE Press, c2009Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2009]Online access: Abstract with links to resource Availability: No items available
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Reliability wearout mechanisms in advanced CMOS technologies / Alvin W. Strong ... [et al.].
by Strong, Alvin Wayne, 1946- | Wiley [publisher.] | IEEE Xplore (Online Service) [distributor.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Piscataway, New Jersey : IEEE Press, c2009Online access: Abstract with links to resource Availability: No items available
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Maintaining Mission Critical Systems in a 24/7 Environment / Peter M. Curtis.
by Curtis, Peter M [author.] | IEEE Xplore (Online Service) [distributor.] | John Wiley & Sons [publisher.]. Edition: 2nd ed.Material type: Book; Format:
available online
Publisher: Hoboken, New Jersey : Wiley-IEEE Press, c2011Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2011]Online access: Abstract with links to resource Availability: No items available
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Design for reliability / edited by Dev Raheja, Louis J. Gullo.
by Raheja, Dev | Gullo, Louis J | IEEE Xplore (Online Service) [distributor.] | Wiley [publisher.]. Material type: Book; Format:
available online
Publisher: Hoboken, New Jersey : Wiley, 2012Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2012]Online access: Abstract with links to resource Availability: No items available
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Beyond redundancy : how geographic redundancy can improve service availability and reliability of computer-based systems / Eric Bauer, Randee Adams, Dan Eustace.
by Bauer, Eric [author.] | Adams, Randee | Eustace, Dan | IEEE Xplore (Online Service) [distributor.] | John Wiley & Sons [publisher.]. Material type: Book; Format:
available online
Publisher: Hoboken, New Jersey : Wiley-IEEE Press, 2011Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2011]Online access: Abstract with links to resource Availability: No items available
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Terrestrial radiation effects in ULSI devices and electronic systems / Eishi H. Ibe.
by Ibe, Eishi H [author.] | IEEE Xplore (Online Service) [distributor.] | Wiley [publisher.]. Material type: Book; Format:
available online
Publisher: Singapore : John Wiley & Sons Inc., 2015Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2014]Online access: Abstract with links to resource Availability: No items available
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