Similarity-Based Pattern Recognition [electronic resource] : First International Workshop, SIMBAD 2011, Venice, Italy, September 28-30, 2011, Proceedings / edited by Marcello Pelillo, Edwin R. Hancock.
Contributor(s): Pelillo, Marcello [editor.] | Hancock, Edwin R [editor.] | SpringerLink (Online service).
Material type: BookSeries: Image Processing, Computer Vision, Pattern Recognition, and Graphics: 7005Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2011Edition: 1st ed. 2011.Description: XIII, 333 p. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9783642244711.Subject(s): Pattern recognition systems | Computer vision | Artificial intelligence | Database management | Algorithms | Application software | Automated Pattern Recognition | Computer Vision | Artificial Intelligence | Database Management | Algorithms | Computer and Information Systems ApplicationsAdditional physical formats: Printed edition:: No title; Printed edition:: No titleDDC classification: 006.4 Online resources: Click here to access online In: Springer Nature eBookSummary: This book constitutes the proceedings of the First International Workshop on Similarity Based Pattern Recognition, SIMBAD 2011, held in Venice, Italy, in September 2011. The 16 full papers and 7 poster papers presented were carefully reviewed and selected from 35 submissions. The contributions are organized in topical sections on dissimilarity characterization and analysis; generative models of similarity data; graph-based and relational models; clustering and dissimilarity data; applications; spectral methods and embedding.No physical items for this record
This book constitutes the proceedings of the First International Workshop on Similarity Based Pattern Recognition, SIMBAD 2011, held in Venice, Italy, in September 2011. The 16 full papers and 7 poster papers presented were carefully reviewed and selected from 35 submissions. The contributions are organized in topical sections on dissimilarity characterization and analysis; generative models of similarity data; graph-based and relational models; clustering and dissimilarity data; applications; spectral methods and embedding.
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