Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications [electronic resource] : 16th Iberoamerican Congress on Pattern Recognition, CIARP 2011, Pucón, Chile, November 15-18, 2011. Proceedings / edited by César San Martin, Sang-Woon Kim.
Contributor(s): San Martin, César [editor.]
| Kim, Sang-Woon [editor.] | SpringerLink (Online service).
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BookSeries: Image Processing, Computer Vision, Pattern Recognition, and Graphics: 7042Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2011Edition: 1st ed. 2011.Description: XVIII, 721 p. 273 illus., 146 illus. in color. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9783642250859.Subject(s): Pattern recognition systems | Computer vision | Artificial intelligence | Biometric identification | Algorithms | Application software | Automated Pattern Recognition | Computer Vision | Artificial Intelligence | Biometrics | Algorithms | Computer and Information Systems ApplicationsAdditional physical formats: Printed edition:: No title; Printed edition:: No titleDDC classification: 006.4 Online resources: Click here to access online
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Springer Nature eBookSummary: This book constitutes the refereed proceedings of the 16th Iberoamerican Congress on Pattern Recognition, CIARP 2011, held in Pucón, Chile, in November 2011. The 81 revised full papers presented together with 3 keynotes were carefully reviewed and selected from numerous submissions. Topics of interest covered are image processing, restoration and segmentation; computer vision; clustering and artificial intelligence; pattern recognition and classification; applications of pattern recognition; and Chilean Workshop on Pattern Recognition.
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This book constitutes the refereed proceedings of the 16th Iberoamerican Congress on Pattern Recognition, CIARP 2011, held in Pucón, Chile, in November 2011. The 81 revised full papers presented together with 3 keynotes were carefully reviewed and selected from numerous submissions. Topics of interest covered are image processing, restoration and segmentation; computer vision; clustering and artificial intelligence; pattern recognition and classification; applications of pattern recognition; and Chilean Workshop on Pattern Recognition.
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