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Thermal-aware testing of digital vlsi circuits and systems / by Santanu Chattopadhyay.

by Chattopadhyay, Santanu [author.] | Taylor and Francis.

Edition: First edition.Material type: book Book; Literary form: Not fiction Publisher: Boca Raton, FL : CRC Press, an imprint of Taylor and Francis, 2018Online access: Click here to view. Availability: No items available

Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.

by Abramovici, Miron [author.] | Breuer, Melvin A | Friedman, Arthur D | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: New York, NY : Computer Science Press, c1990Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1994]Online access: Abstract with links to resource Availability: No items available