Central Library

Normal view MARC view ISBD view

Ultra Low Noise CMOS Image Sensors [electronic resource] / by Assim Boukhayma.

By: Boukhayma, Assim [author.].
Contributor(s): SpringerLink (Online service).
Material type: materialTypeLabelBookSeries: Springer Theses, Recognizing Outstanding Ph.D. Research: Publisher: Cham : Springer International Publishing : Imprint: Springer, 2018Edition: 1st ed. 2018.Description: XIV, 180 p. 110 illus., 69 illus. in color. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9783319687742.Subject(s): Electronics | Signal processing | Electronic circuits | Electronics and Microelectronics, Instrumentation | Signal, Speech and Image Processing | Electronic Circuits and SystemsAdditional physical formats: Printed edition:: No title; Printed edition:: No title; Printed edition:: No titleDDC classification: 621.381 Online resources: Click here to access online
Contents:
Introduction -- Low-Noise CMOS Image Sensors -- Noise Sources and Mechanisms in CIS -- Detailed Noise Analysis in Low-Noise CMOS Image Sensors -- Noise Reduction in CIS Readout Chains -- Design of a Sub-electron Readout Noise Pixel in a Standard CIS Process -- Characterization of a Sub-electron Readout Noise VGA Imager in a Standard CIS Process -- A Passive Switched-Capacitor Circuit For Correlated Multiple Sampling -- Downscaling Effects Towards Photon Counting Capability in CIS -- An Ultra Low Noise CMOS THz Imager -- Conclusion.
In: Springer Nature eBookSummary: This thesis provides a thorough noise analysis for conventional CIS readout chains, while also presenting and discussing a variety of noise reduction techniques that allow the read noise in standard processes to be optimized. Two physical implementations featuring sub-0.5-electron RMS are subsequently presented to verify the proposed noise reduction techniques and provide a full characterization of a VGA imager. Based on the verified noise calculation, the impact of the technology downscaling on the input-referred noise is also studied. Further, the thesis covers THz CMOS image sensors and presents an original design that achieves ultra-low-noise performance. Last but not least, it provides a comprehensive review of CMOS image sensors.
    average rating: 0.0 (0 votes)
No physical items for this record

Introduction -- Low-Noise CMOS Image Sensors -- Noise Sources and Mechanisms in CIS -- Detailed Noise Analysis in Low-Noise CMOS Image Sensors -- Noise Reduction in CIS Readout Chains -- Design of a Sub-electron Readout Noise Pixel in a Standard CIS Process -- Characterization of a Sub-electron Readout Noise VGA Imager in a Standard CIS Process -- A Passive Switched-Capacitor Circuit For Correlated Multiple Sampling -- Downscaling Effects Towards Photon Counting Capability in CIS -- An Ultra Low Noise CMOS THz Imager -- Conclusion.

This thesis provides a thorough noise analysis for conventional CIS readout chains, while also presenting and discussing a variety of noise reduction techniques that allow the read noise in standard processes to be optimized. Two physical implementations featuring sub-0.5-electron RMS are subsequently presented to verify the proposed noise reduction techniques and provide a full characterization of a VGA imager. Based on the verified noise calculation, the impact of the technology downscaling on the input-referred noise is also studied. Further, the thesis covers THz CMOS image sensors and presents an original design that achieves ultra-low-noise performance. Last but not least, it provides a comprehensive review of CMOS image sensors.

There are no comments for this item.

Log in to your account to post a comment.