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Noise Contamination in Nanoscale VLSI Circuits [electronic resource] / by Selahattin Sayil.

By: Sayil, Selahattin [author.].
Contributor(s): SpringerLink (Online service).
Material type: materialTypeLabelBookSeries: Synthesis Lectures on Digital Circuits & Systems: Publisher: Cham : Springer International Publishing : Imprint: Springer, 2022Edition: 1st ed. 2022.Description: XI, 136 p. 95 illus., 42 illus. in color. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9783031127519.Subject(s): Electronic circuits | Embedded computer systems | Nanoelectromechanical systems | Electronic Circuits and Systems | Embedded Systems | Nanoscale DevicesAdditional physical formats: Printed edition:: No title; Printed edition:: No title; Printed edition:: No titleDDC classification: 621.3815 Online resources: Click here to access online
Contents:
Introduction -- Interconnect Noise -- Clock Noise and Uncertainty -- Power Supply Noise -- Substrate Coupling Noise -- Radiation Induced Soft Error Mechanisms -- Thermally Induced Errors -- Impact of Process Variations.
In: Springer Nature eBookSummary: This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.
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Introduction -- Interconnect Noise -- Clock Noise and Uncertainty -- Power Supply Noise -- Substrate Coupling Noise -- Radiation Induced Soft Error Mechanisms -- Thermally Induced Errors -- Impact of Process Variations.

This textbook provides readers with a comprehensive introduction to various noise sources that significantly reduce performance and reliability in nanometer-scale integrated circuits. The author covers different types of noise, such as crosstalk noise caused by signal switching of adjacent wires, power supply noise or IR voltage drop in the power line due to simultaneous buffer / gate switching events, substrate coupling noise, radiation-induced transients, thermally induced noise and noise due to process and environmental Coverages also includes the relationship between some of these noise sources, as well as compound effects, and modeling and mitigation of noise mechanisms.

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