Your search returned 3 results. Subscribe to this search

|
Hot Carrier Degradation in Semiconductor Devices [electronic resource] / edited by Tibor Grasser.

by Grasser, Tibor [editor.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Cham : Springer International Publishing : Imprint: Springer, 2015Online access: Click here to access online Availability: No items available

Bias Temperature Instability for Devices and Circuits [electronic resource] / edited by Tibor Grasser.

by Grasser, Tibor [editor.] | SpringerLink (Online service).

Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: New York, NY : Springer New York : Imprint: Springer, 2014Online access: Click here to access online Availability: No items available

Noise in Nanoscale Semiconductor Devices [electronic resource] / edited by Tibor Grasser.

by Grasser, Tibor [editor.] | SpringerLink (Online service).

Edition: 1st ed. 2020.Source: Springer Nature eBookMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: Cham : Springer International Publishing : Imprint: Springer, 2020Online access: Click here to access online Availability: No items available