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Fundamentals of Bias Temperature Instability in MOS Transistors [electronic resource] : Characterization Methods, Process and Materials Impact, DC and AC Modeling / edited by Souvik Mahapatra.

by Mahapatra, Souvik [editor.] | SpringerLink (Online service).

Edition: 1st ed. 2015.Source: Springer eBooksMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: New Delhi : Springer India : Imprint: Springer, 2016Online access: Click here to access online Availability: No items available

Fundamentals of Bias Temperature Instability in MOS Transistors [electronic resource] : Characterization Methods, Process and Materials Impact, DC and AC Modeling / edited by Souvik Mahapatra.

by Mahapatra, Souvik [editor.] | SpringerLink (Online service).

Edition: 1st ed. 2016.Source: Springer Nature eBookMaterial type: book Book; Format: electronic available online remote; Literary form: Not fiction Publisher: New Delhi : Springer India : Imprint: Springer, 2016Online access: Click here to access online Availability: No items available