000 00410nam a2200145Ia 4500
999 _c31817
_d31817
008 190711s9999 xx 000 0 und d
020 _a0792390253
082 _a621.395 C518
100 _aCheng, Kwang, Ting.
100 _aAgrawal, Vishwani, D.
245 0 _aUnified Methods for VLSI Simulation and Test Generation
260 _aBoston
_bKluwer Academic
_c1989
300 _axii+148p.,24X16Cms
942 _cBK