000 00401nam a2200145Ia 4500
999 _c32956
_d32956
008 190711s9999 xx 000 0 und d
020 _a9781580537094
082 _a621.382 K29
100 _aKelly, Joe
100 _aEngelhardt, Michael
245 0 _aAdvanced Production Testing of RF, SoC, and SiP Devices
260 _aBoston
_bArtech House
_c2007
300 _axx+301p.,23x16cms.
942 _cBK