| 000 | 00452nam a2200157Ia 4500 | ||
|---|---|---|---|
| 999 |
_c33262 _d33262 |
||
| 008 | 190711s9999 xx 000 0 und d | ||
| 020 | _a9780123739735 | ||
| 082 | _a621.395 W246 | ||
| 100 | _aWang, Laung, Terng. | ||
| 100 | _aStroud, Charles, E. | ||
| 100 | _aTouba, Nur, A. | ||
| 245 | 0 |
_aSystem-on-Chip Test Architectures _bNanometer Design for Testability |
|
| 260 |
_aAmsterdam _bElsevier _c2008 |
||
| 300 | _axxxvi+856p.,24X19Cms | ||
| 942 | _cBK | ||