000 | 03573nam a22005895i 4500 | ||
---|---|---|---|
001 | 978-3-662-44482-5 | ||
003 | DE-He213 | ||
005 | 20200421111841.0 | ||
007 | cr nn 008mamaa | ||
008 | 140915s2015 gw | s |||| 0|eng d | ||
020 |
_a9783662444825 _9978-3-662-44482-5 |
||
024 | 7 |
_a10.1007/978-3-662-44482-5 _2doi |
|
050 | 4 | _aTK7888.4 | |
072 | 7 |
_aTJFC _2bicssc |
|
072 | 7 |
_aTEC008010 _2bisacsh |
|
082 | 0 | 4 |
_a621.3815 _223 |
100 | 1 |
_aGoll, Bernhard. _eauthor. |
|
245 | 1 | 0 |
_aComparators in Nanometer CMOS Technology _h[electronic resource] / _cby Bernhard Goll, Horst Zimmermann. |
264 | 1 |
_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg : _bImprint: Springer, _c2015. |
|
300 |
_aXIV, 250 p. 217 illus., 37 illus. in color. _bonline resource. |
||
336 |
_atext _btxt _2rdacontent |
||
337 |
_acomputer _bc _2rdamedia |
||
338 |
_aonline resource _bcr _2rdacarrier |
||
347 |
_atext file _bPDF _2rda |
||
490 | 1 |
_aSpringer Series in Advanced Microelectronics, _x1437-0387 ; _v50 |
|
505 | 0 | _aFundamentals of clocked, regenerative comparators -- State-of-the-art nanometer CMOS -- Measurement circuits and setup -- Comparators in 120 nm CMOS -- Comparators in 65 nm CMOS -- Conclusions and comparison. | |
520 | _aThis book covers the complete spectrum of the fundamentals of clocked, regenerative comparators, their state-of-the-art, advanced CMOS technologies, innovative comparators inclusive circuit aspects, their characterization and properties. Starting from the basics of comparators and the transistor characteristics in nanometer CMOS, seven high-performance comparators developed by the authors in 120nm and 65nm CMOS are described extensively. Methods and measurement circuits for the characterization of advanced comparators are introduced. A synthesis of the largely differing aspects of demands on modern comparators and the properties of devices being available in nanometer CMOS, which are posed by the so-called nanometer hell of physics, is accomplished. The book summarizes the state of the art in integrated comparators. Advanced measurement circuits for characterization will be introduced as well as the method of characterization by bit-error analysis usually being used for characterization of optical receivers. The book is compact, and the graphical quality of the illustrations is outstanding. This book is written for engineers and researchers in industry as well as scientists and Ph.D students at universities. It is also recommendable to graduate students specializing on nanoelectronics and microelectronics or circuit design. | ||
650 | 0 | _aEngineering. | |
650 | 0 | _aNuclear physics. | |
650 | 0 | _aHeavy ions. | |
650 | 0 | _aHadrons. | |
650 | 0 | _aNanotechnology. | |
650 | 0 | _aElectronics. | |
650 | 0 | _aMicroelectronics. | |
650 | 0 | _aElectronic circuits. | |
650 | 0 | _aMaterials science. | |
650 | 1 | 4 | _aEngineering. |
650 | 2 | 4 | _aCircuits and Systems. |
650 | 2 | 4 | _aNuclear Physics, Heavy Ions, Hadrons. |
650 | 2 | 4 | _aNanotechnology and Microengineering. |
650 | 2 | 4 | _aElectronics and Microelectronics, Instrumentation. |
650 | 2 | 4 | _aCharacterization and Evaluation of Materials. |
700 | 1 |
_aZimmermann, Horst. _eauthor. |
|
710 | 2 | _aSpringerLink (Online service) | |
773 | 0 | _tSpringer eBooks | |
776 | 0 | 8 |
_iPrinted edition: _z9783662444818 |
830 | 0 |
_aSpringer Series in Advanced Microelectronics, _x1437-0387 ; _v50 |
|
856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/978-3-662-44482-5 |
912 | _aZDB-2-ENG | ||
942 | _cEBK | ||
999 |
_c55552 _d55552 |