000 05772nam a2200961 i 4500
001 5201823
003 IEEE
005 20200421114109.0
006 m o d
007 cr |n|||||||||
008 040320s2004 njua ob 001 eng d
010 _z 2003057676 (print)
020 _a9780471667209
_qelectronic
020 _z047144653X
_qpaper
020 _z047166720X
_qelectronic
020 _z9780471446538
_qprint
024 7 _a10.1002/047166720X
_2doi
035 _a(CaBNVSL)mat05201823
035 _a(IDAMS)0b0000648104ad8b
040 _aCaBNVSL
_beng
_erda
_cCaBNVSL
_dCaBNVSL
050 4 _aTK7871.9
_b.S56 2004eb
082 0 4 _a621.39/732
_222
100 1 _aSingh, Raminderpal,
_eauthor.
245 1 0 _aSilicon germanium :
_btechnology, modeling, and design /
_cRaminderpal Singh, David Harame, Modest M. Oprysko.
264 1 _aPiscataway, New Jersey :
_bIEEE Press,
_c2004.
264 2 _a[Piscataqay, New Jersey] :
_bIEEE Xplore,
_c[2004]
300 _a1 PDF (xxviii, 340 pages) :
_billustrations.
336 _atext
_2rdacontent
337 _aelectronic
_2isbdmedia
338 _aonline resource
_2rdacarrier
504 _aIncludes bibliographical references and index.
505 0 _aContributors. -- Foreword. -- Preface. -- Acknowledgments. -- Introduction. -- A Historical Perspective at IBM. -- Technology Development. -- Modeling and Characterization. -- Design Automation and Signal Integrity. -- Leading-Edge Applications. -- Appendix. -- Index. -- About the Authors. --
506 1 _aRestricted to subscribers or individual electronic text purchasers.
520 _a"An excellent introduction to the SiGe BiCMOS technology, from the underlying device physics to current applications." -Ron Wilson, EETimes "SiGe technology has demonstrated the ability to provide excellent high-performance characteristics with very low noise, at high power gain, and with excellent linearity. This book is a comprehensive review of the technology and of the design methods that go with it." -Alberto Sangiovanni-Vincentelli Professor, University of California, Berkeley Cofounder, Chief Technology Officer, Member of Board Cadence Design Systems Inc. Filled with in-depth insights and expert advice, Silicon Germanium covers all the key aspects of this technology and its applications. Beginning with a brief introduction to and historical perspective of IBM's SiGe technology, this comprehensive guide quickly moves on to: * Detail many of IBM's SiGe technology development programs * Explore IBM's approach to device modeling and characterization-including predictive TCAD modeling * Discuss IBM's design automation and signal integrity knowledge and implementation methodologies * Illustrate design applications in a variety of IBM's SiGe technologies * Highlight details of highly integrated SiGe BiCMOS system-on-chip (SOC) design Written for RF/analog and mixed-signal designers, CAD designers, semiconductor students, and foundry process engineers worldwide, Silicon Germanium provides detailed insight into the modeling and design automation requirements for leading-edge RF/analog and mixed-signal products, and illustrates in-depth applications that can be implemented using IBM's advanced SiGe process technologies and design kits. "This volume provides an excellent introduction to the SiGe BiCMOS technology, from the underlying device physics to current applications. But just as important is the window the text provides into the infrastructure-the process development, device modeling, and tool development." -Ron Wilson Silicon Engineering Editor, EETimes "This book chronicles the development of SiGe in detail, provides an in-depth look at the modeling and design automation requirements for making advanced applications using SiGe possible, and illustrates such applications as implemented using IBM's process technologies and design methods." -John Kelly Senior Vice President and Group Executive, Technology Group, IBM.
530 _aAlso available in print.
538 _aMode of access: World Wide Web
550 _aMade available online by Ebrary.
588 _aTitle from title screen (viewed Aug. 17, 2004).
588 _aDescription based on PDF viewed 12/21/2015.
650 0 _aSilicon.
650 0 _aGermanium.
655 0 _aElectronic books.
695 _aBiCMOS integrated circuits
695 _aBiographies
695 _aBoron
695 _aCMOS integrated circuits
695 _aCMOS technology
695 _aClocks
695 _aComputational modeling
695 _aDesign automation
695 _aElectrostatic discharge
695 _aEpitaxial growth
695 _aFETs
695 _aHafnium
695 _aHeterojunction bipolar transistors
695 _aImpurities
695 _aIndexes
695 _aIntegrated circuit interconnections
695 _aIntegrated circuit modeling
695 _aJitter
695 _aLayout
695 _aMetals
695 _aPerformance evaluation
695 _aPhase locked loops
695 _aPredictive models
695 _aRadio frequency
695 _aResistors
695 _aSONET
695 _aSemiconductor device modeling
695 _aSemiconductor process modeling
695 _aSilicon
695 _aSilicon germanium
695 _aSolid modeling
695 _aTransistors
695 _aVoltage-controlled oscillators
700 1 _aOprysko, Modest Michael,
_d1957-
700 1 _aHarame, David Louis.
710 2 _aIEEE Xplore (Online Service),
_edistributor.
710 2 _aJohn Wiley & Sons,
_epublisher.
776 0 8 _iPrint version:
_z9780471446538
856 4 2 _3Abstract with links to resource
_uhttp://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201823
942 _cEBK
999 _c59275
_d59275