000			04796nam a2201189 i 4500
001			5266057
003			IEEE
005			20200421114115.0
006			m o d
007			cr |n|||||||||
008			100317t20151990nyua ob 001 0 eng d
020			_a9780470544389 _qelectronic
020			_z9780780310629 _qprint
020			_z0470544384 _qelectronic
024	7		_a10.1109/9780470544389 _2doi
035			_a(CaBNVSL)mat05266057
035			_a(IDAMS)0b000064810c5c91
040			_aCaBNVSL _beng _erda _cCaBNVSL _dCaBNVSL
050		4	_aTK7874 _b.A23 1990eb
082	0	4	_a621.381/5 _222
100	1		_aAbramovici, Miron, _eauthor.
245	1	0	_aDigital systems testing and testable design / _cMiron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
264		1	_aNew York, NY : _bComputer Science Press, _cc1990.
264		2	_a[Piscataqay, New Jersey] : _bIEEE Xplore, _c[1994]
300			_a1 PDF (xxi, 653 pages) : _billustrations.
336			_atext _2rdacontent
337			_aelectronic _2isbdmedia
338			_aonline resource _2rdacarrier
490	1		_aElectrical engineering, communications, and signal processing
504			_aIncludes bibliographical references (p. 644-645) and index.
505	0		_aPreface. How This Book Was Written. Introduction. Modeling. Logic Simulation. Fault Modeling. Fault Simulation. Testing For Single Stuck Faults. Testing For Bridging Faults. Functional Testing. Design For Testability. Compression Techniques. Built-In Self-Test. Logic-Level Diagnosis. Self-Checking Design. PLA Testing. System-Level Diagnosis. Index.
506	1		_aRestricted to subscribers or individual electronic text purchasers.
520			_aThis updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.
530			_aAlso available in print.
538			_aMode of access: World Wide Web
588			_aDescription based on PDF viewed 12/21/2015.
650		0	_aDigital integrated circuits _xTesting.
650		0	_aDigital integrated circuits _xDesign and construction.
655		0	_aElectronic books.
695			_aAlgorithm design and analysis
695			_aAnalytical models
695			_aBooks
695			_aBoolean functions
695			_aBuilt-in self-test
695			_aCircuit faults
695			_aCircuit synthesis
695			_aCombinational circuits
695			_aComplexity theory
695			_aComputational modeling
695			_aControllability
695			_aData models
695			_aData structures
695			_aDecoding
695			_aDesign for testability
695			_aDictionaries
695			_aDigital systems
695			_aDiscrete Fourier transforms
695			_aElectrical fault detection
695			_aEnvironmental factors
695			_aEquations
695			_aError correction codes
695			_aFabrication
695			_aFault detection
695			_aFault diagnosis
695			_aFeedback loop
695			_aGenerators
695			_aGold
695			_aHardware
695			_aIndexes
695			_aIntegrated circuit interconnections
695			_aIntegrated circuit modeling
695			_aIntegrated circuits
695			_aLogic functions
695			_aLogic gates
695			_aMaintenance engineering
695			_aMicroprocessors
695			_aObject oriented modeling
695			_aObservability
695			_aOscillators
695			_aParity check codes
695			_aProgrammable logic arrays
695			_aPrototypes
695			_aRadiation detectors
695			_aRedundancy
695			_aRegisters
695			_aSequential circuits
695			_aSequential diagnosis
695			_aSoftware
695			_aSufficient conditions
695			_aSynchronization
695			_aTarget tracking
695			_aTesting
695			_aTiming
700	1		_aBreuer, Melvin A.
700	1		_aFriedman, Arthur D.
710	2		_aJohn Wiley & Sons, _epublisher.
710	2		_aIEEE Xplore (Online service), _edistributor.
776	0	8	_iPrint version: _z9780780310629
830		0	_aElectrical engineering, communications, and signal processing
856	4	2	_3Abstract with links to resource _uhttp://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057
942			_cEBK
999			_c59519 _d59519