000 07352nam a2201285 i 4500
001 6129686
003 IEEE
005 20200421114120.0
006 m o d
007 cr |n|||||||||
008 151221s2008 njua ob 001 eng d
020 _a9780470370506
_qelectronic
020 _a9786611831349
020 _z6611831347
020 _z9780470230558
_qprint
020 _z0470370505
_qelectronic
020 _z0470370831
_qelectronic
020 _z9780470370834
_qelectronic
024 7 _a10.1002/9780470370506
_2doi
035 _a(CaBNVSL)mat06129686
035 _a(IDAMS)0b0000648173ecbb
040 _aCaBNVSL
_beng
_erda
_cCaBNVSL
_dCaBNVSL
050 4 _aQA76.76.R44
_bD477 2008eb
050 4 _aQA76.76.R44
_bD47 2008eb
082 0 4 _a005.1
_222
245 0 0 _aDependability benchmarking for computer systems /
_cedited by Karama Kanoun, Lisa Spainhower.
264 1 _aHoboken, New Jersey :
_bWiley,
_cc2008.
264 2 _a[Piscataqay, New Jersey] :
_bIEEE Xplore,
_c[2008]
300 _a1 PDF (xviii, 362 pages) :
_billustrations.
336 _atext
_2rdacontent
337 _aelectronic
_2isbdmedia
338 _aonline resource
_2rdacarrier
490 1 _aPractitioners ;
_v72
504 _aIncludes bibliographical references.
505 0 _aPreface vii -- Contributors xi -- Prologue: Dependability Benchmarking: A Reality or a Dream? xiiiKarama Kanoun, Phil Koopman, Henrique Madeira, and Lisa Spainhower -- 1 The Autonomic Computing Benchmark 3Joyce Coleman, Tony Lau, Bhushan Lokhande, Peter Shum, Robert Wisniewski, and Mary Peterson Yost -- 2 Analytical Reliability, Availability, and Serviceability Benchmarks 23Richard Elling, Ira Pramanick, James Mauro, William Bryson, and Dong Tang -- 3 System Recovery Benchmarks 35Richard Elling, Ira Pramanick, James Mauro, William Bryson, and Dong Tang -- 4 Dependability Benchmarking Using Environmental Test Tools 55Cristian Constantinescu -- 5 Dependability Benchmark for OLTP Systems 63Marco Vieira, Jo�o Dur�es, and Henrique Madeira -- 6 Dependability Benchmarking of Web Servers 91Jo�o Dur�es, Marco Vieira, and Henrique Madeira -- 7 Dependability Benchmark of Automotive Engine Control Systems 111Juan-Carlos Ruiz, Pedro Gil, Pedro Yuste, and David de-Andr�s -- 8 Toward Evaluating the Dependability of Anomaly Detectors 141Kymie M. C. Tan and Roy A. Maxion -- 9 Vajra: Evaluating Byzantine-Fault-Tolerant Distributed Systems 163Sonya J. Wierman and Priya Narasimhan -- 10 User-Relevant Software Reliability Benchmarking 185Mario R. Garzia -- 11 Interface Robustness Testing: Experience and Lessons Learned from the Ballista Project 201Philip Koopman, Kobey DeVale, and John DeVale -- 12 Windows and Linux Robustness Benchmarks with Respect to Application Erroneous Behavior 227Karama Kanoun, Yves Crouzet, Ali Kalakech, and Ana-Elena Rugina -- 13 DeBERT: Dependability Benchmarking of Embedded Real-Time Off-the-Shelf Components for Space Applications 255Diamantino Costa, Ricardo Barbosa, Ricardo Maia, and Francisco Moreira -- 14 Benchmarking the Impact of Faulty Drivers: Application to the Linux Kernel 285Arnaud Albinet, Jean Arlat, and Jean-Charles Fabre -- 15 Benchmarking the Operating System against Faults Impacting Operating System Functions 311Ravishankar Iyer, Zbigniew Kalbarczyk, and Weining Gu.
505 8 _a16 Neutron Soft Error Rate Characterization of Microprocessors 341Cristian Constantinescu -- Index 351.
506 1 _aRestricted to subscribers or individual electronic text purchasers.
520 _aA comprehensive collection of benchmarks for measuring dependability in hardware-software systemsAs computer systems have become more complex and mission-critical, it is imperative for systems engineers and researchers to have metrics for a system's dependability, reliability, availability, and serviceability. Dependability benchmarks are useful for guiding development efforts for system providers, acquisition choices of system purchasers, and evaluations of new concepts by researchers in academia and industry.This book gathers together all dependability benchmarks developed to date by industry and academia and explains the various principles and concepts of dependability benchmarking. It collects the expert knowledge of DBench, a research project funded by the European Union, and the IFIP Special Interest Group on Dependability Benchmarking, to shed light on this important area. It also provides a large panorama of examples and recommendations for defining dependability benchmarks.Dependability Benchmarking for Computer Systems includes contributions from a credible mix of industrial and academic sources: IBM, Intel, Microsoft, Sun Microsystems, Critical Software, Carnegie Mellon University, LAAS-CNRS, Technical University of Valencia, University of Coimbra, and University of Illinois. It is an invaluable resource for engineers, researchers, system vendors, system purchasers, computer industry consultants, and system integrators.
530 _aAlso available in print.
538 _aMode of access: World Wide Web
588 _aDescription based on PDF viewed 12/21/2015.
650 0 _aComputer systems
_xReliability.
650 0 _aSoftware engineering.
650 0 _aBenchmarking (Management)
655 0 _aElectronic books.
695 _aAccuracy
695 _aAerospace electronics
695 _aAutomotive engineering
695 _aAvailability
695 _aBenchmark testing
695 _aBusiness
695 _aCircuit faults
695 _aComputational modeling
695 _aComputer crashes
695 _aComputers
695 _aControl systems
695 _aDatabases
695 _aDetectors
695 _aDigital signatures
695 _aEngines
695 _aError correction codes
695 _aFailure analysis
695 _aHardware
695 _aHumans
695 _aIndexes
695 _aIntrusion detection
695 _aKernel
695 _aLinux
695 _aMaintenance engineering
695 _aMeasurement
695 _aMesons
695 _aMicroprocessors
695 _aMonitoring
695 _aNeutrons
695 _aOperating systems
695 _aPetroleum
695 _aPhase measurement
695 _aPistons
695 _aProgram processors
695 _aProposals
695 _aProtocols
695 _aProtons
695 _aReal time systems
695 _aReliability
695 _aRobustness
695 _aSatellites
695 _aScalability
695 _aSea measurements
695 _aSections
695 _aSemiconductor device measurement
695 _aServers
695 _aSoftware
695 _aSoftware reliability
695 _aSoftware testing
695 _aSystem recovery
695 _aTime factors
695 _aTime measurement
695 _aTraining data
695 _aTransient analysis
695 _aVehicles
695 _aWeb servers
700 1 _aKanoun, Karama.
700 1 _aSpainhower, Lisa.
710 2 _aIEEE Xplore (Online Service),
_edistributor.
710 2 _aJohn Wiley & Sons,
_epublisher.
776 0 8 _iPrint version:
_z9780470230558
830 0 _aPractitioners ;
_v72
856 4 2 _3Abstract with links to resource
_uhttp://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129686
942 _cEBK
999 _c59730
_d59730