| 000 | 02048cam a2200337Ii 4500 | ||
|---|---|---|---|
| 001 | 9781315191089 | ||
| 008 | 180417s2017 flu b ob 001 0 eng d | ||
| 020 |
_a9781315191089 _q(e-book : PDF) |
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| 020 |
_a9781351751025 _q(e-book: Mobi) |
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| 020 |
_a9781351751049 _q(e-book: PDF) |
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| 020 |
_z9781498783590 _q(hardback) |
||
| 024 | 7 |
_a10.1201/9781315191089 _2doi |
|
| 035 | _a(OCoLC)992167435 | ||
| 050 | 4 | _aTK7871.95 | |
| 082 | 0 | 4 |
_a621.3815/284 _223 |
| 100 | 1 |
_aDasgupta, Sudeb, _eauthor. _917414 |
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| 245 | 1 | 0 |
_aSpacer engineered FinFET architectures : _bhigh-performance digital circuit applicators / _cby Sudeb Dasgupta, Brajesh Kumar Kaushik, Pankaj Kumar Pal. |
| 250 | _aFirst edition. | ||
| 264 | 1 |
_aBoca Raton, FL : _bRoutledge, an imprint of Taylor and Francis, _c2017. |
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| 300 |
_a1 online resource (138 pages) : _b49 illustrations |
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| 505 | 0 | 0 | _achapter 1 Introduction to Nanoelectronics -- chapter 2 Tri-Gate FinFET Technology and Its Advancement -- chapter 3 Dual-k Spacer Device Architecture and Its Electrostatics -- chapter 4 Capacitive Analysis and Dual-k FinFET-Based Digital Circuit Design -- chapter 5 Design Metric Improvement of a Dual-k Based SRAM Cell -- chapter 6 Statistical Variability and Sensitivity Analysis. |
| 520 | 3 | _aThis book focusses on the spacer engineering aspects of novel MOS-based device circuit co-design in sub-20nm technology node, its process complexity, variability, and reliability issues. It comprehensively explores the FinFET/tri-gate architectures with their circuit/SRAM suitability and tolerance to random statistical variations. | |
| 650 | 0 |
_aMetal oxide semiconductor field-effect transistors. _915501 |
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| 650 | 0 |
_aSilicon-on-insulator technology. _99843 |
|
| 700 | 1 |
_aKaushik, Brajesh Kumar, _eauthor. _917415 |
|
| 700 | 1 |
_aPal, Pankaj Kumar, _eauthor. _917416 |
|
| 710 | 2 |
_aTaylor and Francis. _910719 |
|
| 776 | 0 | 8 |
_iPrint version: _z9781498783590 _w(DLC) 2016051118 |
| 856 | 4 | 0 |
_uhttps://www.taylorfrancis.com/books/9781315191089 _zClick here to view. |
| 942 | _cEBK | ||
| 999 |
_c71521 _d71521 |
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