000 06850nam a2200985 i 4500
001 5237599
003 IEEE
005 20220712205615.0
006 m o d
007 cr |n|||||||||
008 151221s2005 njua ob 001 eng d
010 _z 2004300310 (print)
020 _a9780471728528
_qelectronic
020 _z0471476692
_qpaper
020 _z9780471476696
_qprint
020 _z0471728527
_qelectronic
024 7 _a10.1002/0471728527
_2doi
035 _a(CaBNVSL)mat05237599
035 _a(IDAMS)0b000064810959d5
040 _aCaBNVSL
_beng
_erda
_cCaBNVSL
_dCaBNVSL
050 4 _aTK7871.99.M44
_bS49 2004eb
082 0 4 _a621.38152
_221
100 1 _aSegura, Jaume,
_eauthor.
_926474
245 1 0 _aCMOS electronics :
_bhow it works, how it fails /
_cJaume Segura, Charles F. Hawkins.
264 1 _aHoboken, New Jersey :
_bIEEE Press,
_cc2004.
264 2 _a[Piscataqay, New Jersey] :
_bIEEE Xplore,
_c[2005]
300 _a1 PDF (xvii, 348 pages) :
_billustrations.
336 _atext
_2rdacontent
337 _aelectronic
_2isbdmedia
338 _aonline resource
_2rdacarrier
504 _aIncludes bibliographical references and index.
505 0 _aForeword -- Preface -- PART I: CMOS FUNDAMENTALS -- 1 Electrical Circuit Analysis -- 1.1 Introduction -- 1.2 Voltage and Current Laws -- 1.3 Capacitors -- 1.4 Diodes -- 1.5 Summary -- Bibliography -- Exercises -- 2 Semiconductor Physics -- 2.1 Semiconductor Fundamentals -- 2.2 Intrinsic and Extrinsic Semiconductors -- 2.3 Carrier Transport in Semiconductors -- 2.4 The pn Junction -- 2.5 Biasing the pn Junction: I-V Characteristics -- 2.6 Parasitics in the Diode -- 2.7 Summary -- Bibliography -- Exercises -- 3 MOSFET Transistors -- 3.1 Principles of Operation: Long-Channel Transistors -- 3.2 Threshold Voltage in MOS Transistors -- 3.3 Parasitic Capacitors in MOS Transistors -- 3.4 Device Scaling: Short-Channel MOS Transistors -- 3.5 Summary -- References -- Exercises -- 4 CMOS Basic Gates -- 4.1 Introduction -- 4.2 The CMOS Inverter -- 4.3 NAND Gates -- 4.4 NOR Gates -- 4.5 CMOS Transmission Gates -- 4.6 Summary -- Bibliography -- Exercises -- 5 CMOS Basic Circuits -- 5.1 Combinational logic -- 5.2 Sequential Logic -- 5.3 Input-Output (I/O) Circuitry -- 5.4 Summary -- References -- Exercises -- PART II FAILURE MODES, DEFECTS, AND TESTING OF CMOS Ics -- 6 Failure Mechanisms in CMOS IC Materials -- 6.1 Introduction -- 6.2 Materials Science of IC Metals -- 6.3 Metal Failure Modes -- 6.4 Oxide Failure Modes -- 6.5 Conclusion -- Acknowledgments -- Bibliography -- Exercises -- 7 Bridging Defects -- 7.1 Introduction -- 7.2 Bridges in ICs: Critical Resistance and Modeling -- 7.3 Gate Oxide Shorts (GOS) -- 7.4 Bridges in Combinational Circuits -- 7.5 Bridges in Sequential Circuits -- 7.6 Bridging Faults and Technology Scaling -- 7.7 Conclusion -- References -- Exercises -- 8 Open Defects -- 8.1 Introduction -- 8.2 Modeling Floating Nodes in ICs -- 8.3 Open Defect Classes -- 8.4 Summary -- References -- Exercises -- 9 Parametric Failures -- 9.1 Introduction -- 9.2 Intrinsic Parametric Failures -- 9.3 Intrinsic Parametric Failure Impact on IC Behavior -- 9.4 Extrinsic Parametric Failure.
505 8 _a9.5 Conclusion -- References -- Exercises -- 10 Defect-Based Testing -- 10.1 Introduction -- 10.2 Digital IC Testing: The Basics -- 10.3 Design for Test -- 10.4 Defect-Based Testing (DBT) -- 10.5 Testing Nanometer ICs -- 10.6 Conclusions -- Bibliography -- References -- Exercises -- Appendix A: Solutions to Self-Exercises -- A.1 Chapter 1 -- A.2 Chapter 3 -- A.3 Chapter 4 -- A.4 Chapter 5 -- A.5 Chapter 6 -- A.6 Chapter 7 -- A.8 Chapter 8 -- A.8 Chapter 10 -- Index -- About the Authors.
506 1 _aRestricted to subscribers or individual electronic text purchasers.
520 _aCMOS manufacturing environments are surrounded with symptoms that can indicate serious test, design, or reliability problems, which, in turn, can affect the financial as well as the engineering bottom line. This book educates readers, including non-engineers involved in CMOS manufacture, to identify and remedy these causes. This book instills the electronic knowledge that affects not just design but other important areas of manufacturing such as test, reliability, failure analysis, yield-quality issues, and problems. Designed specifically for the many non-electronic engineers employed in the semiconductor industry who need to reliably manufacture chips at a high rate in large quantities, this is a practical guide to how CMOS electronics work, how failures occur, and how to diagnose and avoid them. Key features: . Builds a grasp of the basic electronics of CMOS integrated circuits and then leads the reader further to understand the mechanisms of failure.. Unique descriptions of circuit failure mechanisms, some found previously only in research papers and others new to this publication.. Targeted to the CMOS industry (or students headed there) and not a generic introduction to the broader field of electronics.. Examples, exercises, and problems are provided to support the self-instruction of the reader.
530 _aAlso available in print.
538 _aMode of access: World Wide Web
588 _aDescription based on PDF viewed 12/21/2015.
650 0 _aMetal oxide semiconductors, Complementary.
_93260
655 0 _aElectronic books.
_93294
695 _aAtomic layer deposition
695 _aBiographies
695 _aBridge circuits
695 _aCMOS integrated circuits
695 _aCapacitance
695 _aCapacitors
695 _aCharge carrier processes
695 _aCircuit analysis
695 _aCircuit faults
695 _aCopper
695 _aCouplings
695 _aEnergy states
695 _aEquations
695 _aGrain boundaries
695 _aIndexes
695 _aInsulators
695 _aIntegrated circuit interconnections
695 _aIntegrated circuit modeling
695 _aIntegrated circuits
695 _aInverters
695 _aLogic gates
695 _aMOSFET circuits
695 _aMOSFETs
695 _aMathematical model
695 _aMetals
695 _aNoise
695 _aPins
695 _aRails
695 _aResistance
695 _aResistors
695 _aSilicon
695 _aSolids
695 _aSubstrates
695 _aTesting
695 _aThreshold voltage
695 _aTopology
695 _aTransistors
695 _aVoltage measurement
700 1 _aHawkins, Charles F.
_926475
710 2 _aJohn Wiley & Sons,
_epublisher.
_96902
710 2 _aIEEE Xplore (Online service),
_edistributor.
_926476
776 0 8 _iPrint version:
_z9780471476696
856 4 2 _3Abstract with links to resource
_uhttps://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237599
942 _cEBK
999 _c73784
_d73784