000 04618nam a2200973 i 4500
001 5263122
003 IEEE
005 20220712205627.0
006 m o d
007 cr |n|||||||||
008 100317t20151998nyua ob 001 0 eng d
020 _a9780470545409
_qelectronic
020 _z9780780311732
_qprint
020 _z0470545402
_qelectronic
024 7 _a10.1109/9780470545409
_2doi
035 _a(CaBNVSL)mat05263122
035 _a(IDAMS)0b000064810c3286
040 _aCaBNVSL
_beng
_erda
_cCaBNVSL
_dCaBNVSL
050 4 _aTK7895.M4
_bN634 1998eb
082 0 4 _a621.39/732
_222
245 0 0 _aNonvolatile semiconductor memory technology :
_ba comprehensive guide to understanding and to using NVSM devices /
_cedited by William D. Brown, Joe E. Brewer.
264 1 _aNew York :
_bIEEE Press,
_cc1998.
264 2 _a[Piscataqay, New Jersey] :
_bIEEE Xplore,
_c[1997]
300 _a1 PDF (xxiii, 589 pages) :
_billustrations.
336 _atext
_2rdacontent
337 _aelectronic
_2isbdmedia
338 _aonline resource
_2rdacarrier
490 1 _aIEEE Press series on microelectronic systems ;
_v6
504 _aIncludes bibliographical references (p. 483-553) and index.
505 0 _aBasics of nonvolatile semiconductor memory devices / G. Groeseneken ... [et al.] -- Floating gate planar devices / H.C. Lin and R. Ramaswami -- Floating gate nonplanar devices / H.A.R. Wegener and W. Owen -- Floating gate flash devices / M. Gill and S. Lai -- SONOS nonvolatile semiconductor memories / M.H. White and F.R. Libsch -- Reliability and NVSM reliability / Y. Hsia and V.C. Tyree -- Radiation tolerance / G. Messenger -- Procurement considerations / D. Sweetman.
506 1 _aRestricted to subscribers or individual electronic text purchasers.
520 _a"Complete dependence on semiconductor vendors' application notes and data sheets is now a thing of the past thanks to this all-in-one comparison text on nonvolatile semiconductor memory (NVSM) technology. Working electronics engineers can now refer to this book to access the technical data and applications-focused perspective they need to make intelligent decisions regarding the selection, specification, procurement, and application of NVSM devices. The most comprehensive book in the field, NONVOLATILE SEMICONDUCTOR MEMORY TECHNOLOGY gathers expertly-written information scattered throughout device literature in a single, well-balanced volume. This book features an in-depth overview accompanied by applications-oriented chapters on device reliability and endurance, radiation tolerance, as well as device physics and design. It is an essential reference for electronics engineers." Sponsored by: IEEE Components, Packaging, and Manufacturing Technology Society, IEEE Solid-State Circuits Council/Society.
530 _aAlso available in print.
538 _aMode of access: World Wide Web
588 _aDescription based on PDF viewed 12/21/2015.
650 0 _aSemiconductor storage devices.
_913974
655 0 _aElectronic books.
_93294
695 _aAerospace electronics
695 _aArrays
695 _aBelts
695 _aBibliographies
695 _aBiographies
695 _aCapacitors
695 _aCosmic rays
695 _aDielectrics
695 _aEPROM
695 _aElectric potential
695 _aElectrodes
695 _aFailure analysis
695 _aFlash memory
695 _aHistory
695 _aIndexes
695 _aInsulators
695 _aIntegrated circuit reliability
695 _aIntegrated circuits
695 _aLogic gates
695 _aNeutrons
695 _aNonvolatile memory
695 _aOrbits
695 _aPerformance evaluation
695 _aPower supplies
695 _aProcurement
695 _aProgramming
695 _aProtons
695 _aRandom access memory
695 _aReliability
695 _aReliability engineering
695 _aSONOS devices
695 _aSatellites
695 _aSemiconductor memory
695 _aSilicon
695 _aTesting
695 _aTiming
695 _aTransistors
695 _aTunneling
700 1 _aBrewer, Joe
_q(Joe E.)
_926121
700 1 _aBrown, William D.,
_d1943-
_926554
710 2 _aJohn Wiley & Sons,
_epublisher.
_96902
710 2 _aIEEE Xplore (Online service),
_edistributor.
_926597
776 0 8 _iPrint version:
_z9780780311732
830 0 _aIEEE Press series on microelectronic systems ;
_v6
_96746
856 4 2 _3Abstract with links to resource
_uhttps://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263122
942 _cEBK
999 _c73822
_d73822