000 | 06254nam a2201309 i 4500 | ||
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001 | 5263338 | ||
003 | IEEE | ||
005 | 20220712205630.0 | ||
006 | m o d | ||
007 | cr |n||||||||| | ||
008 | 100317t20151998nyua ob 001 0 eng d | ||
020 |
_a9780470545317 _qelectronic |
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020 |
_z9780780334823 _qprint |
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020 |
_z0470545313 _qelectronic |
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024 | 7 |
_a10.1109/9780470545317 _2doi |
|
035 | _a(CaBNVSL)mat05263338 | ||
035 | _a(IDAMS)0b000064810c353f | ||
040 |
_aCaBNVSL _beng _erda _cCaBNVSL _dCaBNVSL |
||
050 | 4 |
_aTK7885 _b.P85 1998eb |
|
082 | 0 | 4 |
_a004.2/1/01176 _222 |
100 | 1 |
_aPukite, Jan, _d1928- _926632 |
|
245 | 1 | 0 |
_aModeling for reliability analysis : _bMarkov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems / _cJan Pukite, Paul Pukite. |
264 | 1 |
_aNew York : _bIEEE Press, _cc1998. |
|
264 | 2 |
_a[Piscataqay, New Jersey] : _bIEEE Xplore, _c[1998] |
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300 |
_a1 PDF (xix, 258 pages) : _billustrations. |
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336 |
_atext _2rdacontent |
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337 |
_aelectronic _2isbdmedia |
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338 |
_aonline resource _2rdacarrier |
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490 | 1 |
_aIEEE Press series on engineering of complex computer systems ; _v2 |
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504 | _aIncludes bibliographical references (p. 245-248) and index. | ||
505 | 0 | _aSeries Introduction. Preface. Introduction. System Requirements and Design. Foundations of Probability Theory. Basic Reliability Concepts. Basic Reliability Models. Markov Process Fundamentals. Hardware Reliability Modeling. Software Reliability Modeling. Combined Hardware-Software Reliability Modeling. Modeling of Large and Complex Systems. Maintainability Modeling. Availability Modeling. Safety Modeling. Markov Model Evaluation. Effectiveness Modeling. Support Analyses. Application Examples. Practical Design of Fault-Tolerant Systems. CARMS User's Guide. CARMS Model Library. CARMS Reference. Definitions and Acronyms. References. Index. About the Authors. | |
506 | 1 | _aRestricted to subscribers or individual electronic text purchasers. | |
520 | _a"Markov modeling has long been accepted as a fundamental and powerful technique for the fault tolerance analysis of mission-critical applications. However, the elaborate computations required have often made Markov modeling too time-consuming to be of practical use on these complex systems. With this hands-on tool, designers can use the Markov modeling technique to analyze safety, reliability, maintainability, and cost-effectiveness factors in the full range of complex systems in use today. Featuring ground-breaking simulation software and a comprehensive reference manual, MARKOV MODELING FOR RELIABILITY ANALYSIS helps system designers surmount the mathematical computations that have previously prevented effective reliability analysis. The text and software compose a valuable self-study tool that is complete with detailed explanations, examples, and a library of Markov models that can be used for experiments and as derivations for new simulation models. The book details how these analyses are conducted, while providing hands-on instruction on how to develop reliability models for the full range of system configurations. Computer-Aided Rate Modeling and Simulation (CARMS) software is an integrated modeling tool that includes a diagram-based environment for model setup, a spreadsheet like interface for data entry, an expert system link for automatic model construction, and an interactive graphic interface for displaying simulation results.". | ||
530 | _aAlso available in print. | ||
538 | _aMode of access: World Wide Web | ||
588 | _aDescription based on PDF viewed 12/21/2015. | ||
650 | 0 |
_aComputer engineering. _910164 |
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650 | 0 |
_aReliability (Engineering) _xMathematical models. _926633 |
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655 | 0 |
_aElectronic books. _93294 |
|
695 | _aAccuracy | ||
695 | _aAerospace electronics | ||
695 | _aAircraft | ||
695 | _aAircraft navigation | ||
695 | _aAnalytical models | ||
695 | _aApproximation methods | ||
695 | _aAssembly | ||
695 | _aAvailability | ||
695 | _aBibliographies | ||
695 | _aBiographies | ||
695 | _aBiological system modeling | ||
695 | _aCalculus | ||
695 | _aCentral Processing Unit | ||
695 | _aCircuit faults | ||
695 | _aComplexity theory | ||
695 | _aComputational modeling | ||
695 | _aConvolution | ||
695 | _aData models | ||
695 | _aDatabases | ||
695 | _aDistribution functions | ||
695 | _aDoppler radar | ||
695 | _aEquations | ||
695 | _aError analysis | ||
695 | _aExpert systems | ||
695 | _aFault detection | ||
695 | _aFault tolerance | ||
695 | _aFault tolerant systems | ||
695 | _aFault trees | ||
695 | _aHardware | ||
695 | _aIndexes | ||
695 | _aInjuries | ||
695 | _aIntegrated circuit modeling | ||
695 | _aLoad modeling | ||
695 | _aLoading | ||
695 | _aLogistics | ||
695 | _aMaintenance engineering | ||
695 | _aMarkov processes | ||
695 | _aMathematical model | ||
695 | _aMice | ||
695 | _aNoise | ||
695 | _aNumerical models | ||
695 | _aOperating systems | ||
695 | _aPositron emission tomography | ||
695 | _aPressing | ||
695 | _aProbabilistic logic | ||
695 | _aProbability | ||
695 | _aRandom variables | ||
695 | _aRead only memory | ||
695 | _aRedundancy | ||
695 | _aReliability | ||
695 | _aReliability engineering | ||
695 | _aSafety | ||
695 | _aSilicon | ||
695 | _aSoftware | ||
695 | _aSoftware reliability | ||
695 | _aSolid modeling | ||
695 | _aSteady-state | ||
695 | _aSystem analysis and design | ||
695 | _aSystem performance | ||
695 | _aTerminology | ||
695 | _aTesting | ||
695 | _aTires | ||
695 | _aVectors | ||
695 | _aWeapons | ||
695 | _aWeibull distribution | ||
700 | 1 |
_aPukite, Paul. _926634 |
|
710 | 2 |
_aJohn Wiley & Sons, _epublisher. _96902 |
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710 | 2 |
_aIEEE Xplore (Online service), _edistributor. _926635 |
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776 | 0 | 8 |
_iPrint version: _z9780780334823 |
830 | 0 |
_aIEEE Press series on engineering of complex computer systems ; _v2 _926636 |
|
856 | 4 | 2 |
_3Abstract with links to resource _uhttps://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338 |
942 | _cEBK | ||
999 |
_c73833 _d73833 |