000			05299nam a2201009 i 4500
001			5265097
003			IEEE
005			20220712205654.0
006			m o d
007			cr |n|||||||||
008			100317t20151999njua ob 001 0 eng d
020			_a9780470544921 _qelectronic
020			_z9780780334472 _qprint
020			_z0470544929 _qelectronic
024	7		_a10.1109/9780470544921 _2doi
035			_a(CaBNVSL)mat05265097
035			_a(IDAMS)0b000064810c4c2f
040			_aCaBNVSL _beng _erda _cCaBNVSL _dCaBNVSL
050		4	_aTK7874 _b.I4713 1998eb
082	0	4	_a621.3815 _222
245	0	0	_aIntegrated circuit manufacturability : _bthe art of process and design integration / _cedited by Jos�e Pineda de Gyvez, Dhiraj Pradhan.
264		1	_aPiscataway, New Jersey : _bIEEE Press, _cc1999.
264		2	_a[Piscataqay, New Jersey] : _bIEEE Xplore, _c[1998]
300			_a1 PDF (xv, 316 pages) : _billustrations.
336			_atext _2rdacontent
337			_aelectronic _2isbdmedia
338			_aonline resource _2rdacarrier
500			_a"IEEE Circuits and Systems Society, sponsor."
504			_aIncludes bibliographical references and index.
505	0		_aPreface. Introduction (Jose Pineda de Gyvez). Defect Monitoring and Characterization (Eric Bruls). Digital CMOS Fault Modeling and Inductive Fault Analysis (Manoj Sachdev). Functional Yield Modeling (Gary C. Cheek and Geoff O'Donoghue). Critical Area and Fault Probability Prediction (D.M.H. Walker). Statistical Methods of Parametric Yield and Quality Enhancement (Maciej Styblinski). Architectural Fault Tolerance (S.K. Tewksbury). Design for Test and Manufacturability (Dhiraj Pradhan and Adit Singh). Testing Solutions for MCM Manufacturing (Yervant Zorian). Index. About the Editors.
506	1		_aRestricted to subscribers or individual electronic text purchasers.
520			_a"INTEGRATED CIRCUIT MANUFACTURABILITY provides comprehensive coverage of the process and design variables that determine the ease and feasibility of fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage. INTEGRATED CIRCUIT MANUFACTURABILITY illustrates the implications of manufacturability at every level of abstraction, including the effects of defects on the layout, their mapping to electrical faults, and the corresponding approaches to detect such faults. The reader will be introduced to key practical issues normally applied in industry and usually required by quality, product, and design engineering departments in today's design practices: * Yield management strategies * Effects of spot defects * Inductive fault analysis and testing * Fault-tolerant architectures and MCM testing strategies. This book will serve design and product engineers both from academia and industry. It can also be used as a reference or textbook for introductory graduate-level courses on manufacturing.".
530			_aAlso available in print.
538			_aMode of access: World Wide Web
588			_aDescription based on PDF viewed 12/21/2015.
650		0	_aIntegrated circuits _xComputer-aided design. _99154
650		0	_aMetal oxide semiconductors, Complementary _xComputer-aided design. _926722
650		0	_aIntegrated circuits _xTesting. _926921
655		0	_aElectronic books. _93294
695			_aDelay
695			_aDigital signal processing
695			_aFault tolerance
695			_aFault tolerant systems
695			_aIndexes
695			_aIntegrated circuit modeling
695			_aIntegrated circuits
695			_aLayout
695			_aLithography
695			_aLogic gates
695			_aMaintenance engineering
695			_aManufacturing
695			_aManufacturing processes
695			_aMaterials
695			_aMathematical model
695			_aMetals
695			_aMobile communication
695			_aMonitoring
695			_aProbes
695			_aProduction
695			_aRLC circuits
695			_aRandom variables
695			_aReliability
695			_aSections
695			_aSemiconductor device modeling
695			_aSolid modeling
695			_aStatistical analysis
695			_aSubstrates
695			_aTesting
695			_aVery large scale integration
695			_aAssembly
695			_aAtmospheric modeling
695			_aBiographies
695			_aCMOS integrated circuits
695			_aCircuit faults
695			_aCircuit optimization
695			_aCircuit synthesis
695			_aComputational modeling
695			_aContamination
700	1		_aPradhan, Dhiraj K. _926922
700	1		_aPineda de Gyvez, Jos�e. _926923
710	2		_aJohn Wiley & Sons, _epublisher. _96902
710	2		_aIEEE Circuits and Systems Society. _926924
710	2		_aIEEE Xplore (Online service), _edistributor. _926925
776	0	8	_iPrint version: _z9780780334472
856	4	2	_3Abstract with links to resource _uhttps://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265097
942			_cEBK
999			_c73915 _d73915