000 12546nam a2202737 i 4500
001 5271197
003 IEEE
005 20220712205711.0
006 m o d
007 cr |n|||||||||
008 151221s2010 njua ob 001 eng d
020 _a9780470547205
_qelectronic
020 _z9780471202400
_qprint
020 _z0470547200
_qelectronic
024 7 _a10.1109/9780470547205
_2doi
035 _a(CaBNVSL)mat05271197
035 _a(IDAMS)0b000064810cc94b
040 _aCaBNVSL
_beng
_erda
_cCaBNVSL
_dCaBNVSL
050 4 _aTK7871 .85
_b.N49 2002eb
082 0 4 _a621.3815/2
_222
100 1 _aNg, Kwok Kwok,
_d1952-
_927121
245 1 0 _aComplete guide to semiconductor devices /
_cKwok K. Ng.
250 _a2nd ed.
264 1 _a[United States?] :
_bIEEE Press,
_cc2002.
264 2 _a[Piscataqay, New Jersey] :
_bIEEE Xplore,
_c[2010]
300 _a1 PDF (xxii, 740 pages) :
_billustrations.
336 _atext
_2rdacontent
337 _aelectronic
_2isbdmedia
338 _aonline resource
_2rdacarrier
504 _aIncludes bibliographical references and index.
505 0 _aPreface. Preface to the First Edition. Introduction. DIODES I: RECTIFIERS. p-n Junction Diode. p-i-n Diode. Schottky-Barrier Diode. Planar-Doped-Barrier (PDB) Diode. Isotype Heterojunction. DIODES II: NEGATIVE RESISTANCE N-SHAPED. Tunnel Diode. Transferred-Electron Device (TED). Resonant-Tunneling Diode. Resonant-Interband-Tunneling (RIT) Diode. Single-Barrier Tunnel Diode. Single-Barrier Tunnel Diode. Single-Barrier Interband-Tunneling Diode. Real-Space-Transfer (RST) Diode. DIODES III: NEGATIVE RESISTANCE S-SHAPED. Metal-Insulator-Semiconductor Switch (MISS). Planar-Doped-Barrier (PDB) Switch. Amorphous Threshold Switch. Heterostructure Hot-Electron Diode (HHED). DIODES IV: NEGATIVE RESISTANCE TRANSIT-TIME. Impact-Ionization-Avalanche Transit-Time (IMPATT) Diode. Barrier-Injection Transit-Time (BARITT) Diode. RESISTIVE AND CAPACITIVE DEVICES. Resistor. Metal-Oxide-Semiconductor (MOS) Capacitor. Charge-Coupled Device (CCD). TRANSISTORS I: FIELD-EFFECT. Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET). Junction Field-Effect Transistor (JFET). Metal-Semiconductor Field-Effect Transistor (MESFET). Modulation-Doped Field-Effect Transistor (MODFET). Permeable-Base Transistor. Static-Induction Transistor (SIT). Real-Space-Transfer (RST) Transistor. Planar-Doped Field-Effect Transistor. Surface-Tunnel Transistor. Lateral Resonant-Tunneling Field-Effect Transistor (LRTFET). Stark-Effect Transistor. Velocity-Modulation Transistor (VMT). TRANSISTOR II: POTENTIAL-EFFECT. Bipolar Transistor. Tunneling Hot-Electron-Transfer Amplifier (THETA). Metal-Base Transistor. Bipolar Inversion-Channel Field-Effect Transistor (BICFET). Tunnel-Emitter Transistor (TETRAN). Planar-Doped-Barrier (PDB) Transistor. Heterojunction Hot-Electron Transistor (HHET). Induced-Base Transistor. Resonant-Tunneling Bipolar Transistor (RTBT/RBT). Resonant-Tunneling Hot-Electron Transistor (RHET). Quantum-Well-Base Resonant-Tunneling Transistor (QWBRTT). Spin-Valve Transistor. NONVOLATILE MEMORIES. Floating-Gate Avalanche-Injection Metal-Oxide-Semiconductor (FAMOS) Transistor. Metal-Nitride-Oxide-Semiconductor (MNOS) Transistor. THYRISTORS AND POWER DEVICES. Silicon-Controlled Rectifier (SCR). Insulated-Gate Bipolar Transistor (IGBT). Static-Induction Thyristor (SIThy). Unijunction Transistor. PHOTONICS I: LIGHT SOURCES. Light-Emitting Diode (LED). Injection Laser. PHOTONICS II: PHOTODETECTORS. Photoconductor. p-i-n Photodiode. Schottky-Barrier Photodiode. Charge-Coupled Image Sensor (CCIS). Avalanche Photodiode (APD). Phototransistor. Metal-Smiconductor-Metal (MSM) Photodetector. Quantum-Well Infrared Photodetector (QWIP). Quantum-Dot Infrared Photodetector (QDIP). Blocked-Impurity-Band (BIB) Photodetector. Negative-Electron-Affinity (NEA) Photocathode. Photon-Drag Detector. PHOTONICS III: BISTABLE OPTICAL DEVICES. Self-Electrooptic-Effect Device (SEED). Bistable Etalon. PHOTONICS IV: OTHER DEVICES. Solar Cell. Electroabsorption Modulator. Thermistor. Hall Plate. Strain Gauge (Gage). Interdigital Transducer (IDT). Ion-Sensitive Field-Effect Transistor (ISFET). Appendix A: Selected Nonsemiconductor Devices. Appendix B: Physical Phenomena. Appendix C: General Applications of Device Groups. Appendix D: Physical Properties. Appendix E: Background Information. Index.
506 1 _aRestricted to subscribers or individual electronic text purchasers.
520 _aA definitive and up-to-date handbook of semiconductor devices Semiconductor devices, the basic components of integrated circuits, are responsible for the rapid growth of the electronics industry over the past fifty years. Because there is a growing need for faster and more complex systems for the information age, existing semiconductor devices are constantly being studied for improvement, and new ones are being continually invented. As a result, a large number of types and variations of devices are available in the literature. The Second Edition of this unique engineering guide continues to be the only available complete collection of semiconductor devices, identifying 74 major devices and more than 200 variations of these devices. As in the First Edition, the value of this text lies in its comprehensive, yet highly readable presentation and its easy-to-use format, making it suitable for a wide range of audiences. . Essential information is presented for a quick, balanced overview. Each chapter is designed to cover only one specific device, for easy and focused reference. Each device is discussed in detail, always including its history, its structure, its characteristics, and its applications The Second Edition has been significantly updated with eight new chapters, and the material rearranged to reflect recent developments in the field. As such, it remains an ideal reference source for graduate students who want a quick survey of the field, as well as for practitioners and researchers who need quick access to basic information, and a valuable pragmatic handbook for salespeople, lawyers, and anyone associated with the semiconductor industry.
530 _aAlso available in print.
538 _aMode of access: World Wide Web
588 _aDescription based on PDF viewed 12/21/2015.
650 0 _aSemiconductors
_vHandbooks, manuals, etc.
_913586
650 0 _aSemiconductors
_xHistory.
_927122
655 0 _aElectronic books.
_93294
695 _aNonhomogeneous media
695 _aNonvolatile memory
695 _aOptical bistability
695 _aOptical devices
695 _aOptical feedback
695 _aOptical fibers
695 _aOptical modulation
695 _aOptical reflection
695 _aOptical refraction
695 _aOptical surface waves
695 _aOptical switches
695 _aOptical variables control
695 _aOscillators
695 _aOxidation
695 _aP-i-n diodes
695 _aP-n junctions
695 _aPIN photodiodes
695 _aPatents
695 _aPeriodic structures
695 _aPhonons
695 _aPhotoconducting materials
695 _aPhotoconductivity
695 _aPhotodetectors
695 _aPhotodiodes
695 _aPhotoelectricity
695 _aPhotonics
695 _aPhototransistors
695 _aPhotovoltaic cells
695 _aPiezoelectric devices
695 _aPixel
695 _aProgramming
695 _aQuantum capacitance
695 _aQuantum dots
695 _aQuantum well devices
695 _aQuantum wells
695 _aRadiation effects
695 _aRadiative recombination
695 _aRadio frequency
695 _aRectifiers
695 _aReflection
695 _aRegisters
695 _aResistance
695 _aResonant tunneling devices
695 _aSQUIDs
695 _aSatellites
695 _aScattering
695 _aSchottky diodes
695 _aSemiconductor device measurement
695 _aSemiconductor diodes
695 _aSemiconductor lasers
695 _aSemiconductor waveguides
695 _aSensors
695 _aSilicides
695 _aSilicon
695 _aSolids
695 _aSpin valves
695 _aSpontaneous emission
695 _aStimulated emission
695 _aStrain
695 _aStrain measurement
695 _aSubstrates
695 _aSuperlattices
695 _aSurface acoustic wave devices
695 _aSurface acoustic waves
695 _aSurface treatment
695 _aSwitches
695 _aTemperature
695 _aTemperature dependence
695 _aTemperature distribution
695 _aTemperature measurement
695 _aTemperature sensors
695 _aThermal conductivity
695 _aThermal expansion
695 _aThermal resistance
695 _aThermionic emission
695 _aThermistors
695 _aThreshold current
695 _aThreshold voltage
695 _aThyristors
695 _aTransconductance
695 _aTransducers
695 _aTransistors
695 _aTunneling
695 _aVaristors
695 _aVoltage control
695 _aWire
695 _aAbsorption
695 _aAcoustic waves
695 _aAluminum
695 _aAmorphous silicon
695 _aAmplitude modulation
695 _aAnodes
695 _aApproximation methods
695 _aArrays
695 _aAvalanche breakdown
695 _aAvalanche photodiodes
695 _aBipolar transistors
695 _aBolometers
695 _aCameras
695 _aCapacitance
695 _aCapacitors
695 _aCathodes
695 _aCeramics
695 _aCharge carrier processes
695 _aCharge coupled devices
695 _aCharge transfer
695 _aConductivity
695 _aCrystals
695 _aDark current
695 _aDelay
695 _aDetectors
695 _aDielectrics
695 _aDoping
695 _aDoping profiles
695 _aEPROM
695 _aElectric fields
695 _aElectric potential
695 _aElectrodes
695 _aElectroluminescence
695 _aElectromagnetic spectrum
695 _aElectron mobility
695 _aElectron traps
695 _aElectron tubes
695 _aEpitaxial growth
695 _aEpitaxial layers
695 _aEquations
695 _aFETs
695 _aFilms
695 _aFingers
695 _aFrequency modulation
695 _aGallium arsenide
695 _aGas lasers
695 _aGermanium
695 _aGlow discharges
695 _aGratings
695 _aHEMTs
695 _aHeat sinks
695 _aHeat transfer
695 _aHeterojunctions
695 _aHigh temperature superconductors
695 _aHistory
695 _aImage sensors
695 _aImpurities
695 _aIndexes
695 _aIndium gallium arsenide
695 _aInsulated gate bipolar transistors
695 _aInsulators
695 _aIntegrated optics
695 _aIonization
695 _aIons
695 _aJFETs
695 _aJunctions
695 _aLaser modes
695 _aLaser theory
695 _aLattices
695 _aLight emitting diodes
695 _aLinearity
695 _aLithography
695 _aLogic gates
695 _aMESFETs
695 _aMOCVD
695 _aMODFETs
695 _aMOS capacitors
695 _aMOSFET circuits
695 _aMagnetic field measurement
695 _aMagnetic fields
695 _aMagnetic tunneling
695 _aMagnetization
695 _aMagnetomechanical effects
695 _aMagnetometers
695 _aMagnetoresistance
695 _aMagnetoresistive devices
695 _aMasers
695 _aMaterials
695 _aMetals
695 _aMicrowave circuits
695 _aMicrowave devices
695 _aMicrowave filters
695 _aMicrowave oscillators
695 _aMixers
695 _aModulation
695 _aMolecular beam epitaxial growth
695 _aMoment methods
695 _aMonte Carlo methods
695 _aNeodymium
695 _aNoise
710 2 _aJohn Wiley & Sons,
_epublisher.
_96902
710 2 _aIEEE Xplore (Online service),
_edistributor.
_927123
776 0 8 _iPrint version:
_z9780471202400
856 4 2 _3Abstract with links to resource
_uhttps://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5271197
942 _cEBK
999 _c73972
_d73972