000 03306nam a22005655i 4500
001 978-3-319-75465-9
003 DE-He213
005 20220801215727.0
007 cr nn 008mamaa
008 180418s2018 sz | s |||| 0|eng d
020 _a9783319754659
_9978-3-319-75465-9
024 7 _a10.1007/978-3-319-75465-9
_2doi
050 4 _aTK7867-7867.5
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
072 7 _aTJFC
_2thema
082 0 4 _a621.3815
_223
100 1 _aChampac, Victor.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_946107
245 1 0 _aTiming Performance of Nanometer Digital Circuits Under Process Variations
_h[electronic resource] /
_cby Victor Champac, Jose Garcia Gervacio.
250 _a1st ed. 2018.
264 1 _aCham :
_bSpringer International Publishing :
_bImprint: Springer,
_c2018.
300 _aXVIII, 185 p. 116 illus., 91 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aFrontiers in Electronic Testing ;
_v39
505 0 _aIntroduction -- Mathematical Fundamentals -- Process Variations -- Gate delay under process variations -- Path Delay Under Process Variations -- Circuit Analysis under Process Variations -- FinFET Technology and design issues.
520 _aThis book discusses the digital design of integrated circuits under process variations, with a focus on design-time solutions. The authors describe a step-by-step methodology, going from logic gates to logic paths to the circuit level. Topics are presented in comprehensively, without overwhelming use of analytical formulations. Emphasis is placed on providing digital designers with understanding of the sources of process variations, their impact on circuit performance and tools for improving their designs to comply with product specifications. Various circuit-level “design hints” are highlighted, so that readers can use then to improve their designs. A special treatment is devoted to unique design issues and the impact of process variations on the performance of FinFET based circuits. This book enables readers to make optimal decisions at design time, toward more efficient circuits, with better yield and higher reliability.
650 0 _aElectronic circuits.
_919581
650 0 _aMicroprocessors.
_946108
650 0 _aComputer architecture.
_93513
650 0 _aElectronics.
_93425
650 1 4 _aElectronic Circuits and Systems.
_946109
650 2 4 _aProcessor Architectures.
_946110
650 2 4 _aElectronics and Microelectronics, Instrumentation.
_932249
700 1 _aGarcia Gervacio, Jose.
_eauthor.
_4aut
_4http://id.loc.gov/vocabulary/relators/aut
_946111
710 2 _aSpringerLink (Online service)
_946112
773 0 _tSpringer Nature eBook
776 0 8 _iPrinted edition:
_z9783319754642
776 0 8 _iPrinted edition:
_z9783319754666
776 0 8 _iPrinted edition:
_z9783030092399
830 0 _aFrontiers in Electronic Testing ;
_v39
_946113
856 4 0 _uhttps://doi.org/10.1007/978-3-319-75465-9
912 _aZDB-2-ENG
912 _aZDB-2-SXE
942 _cEBK
999 _c77800
_d77800