| 000 | 02997nam a22005295i 4500 | ||
|---|---|---|---|
| 001 | 978-3-319-91204-2 | ||
| 003 | DE-He213 | ||
| 005 | 20220801221530.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 180706s2019 sz | s |||| 0|eng d | ||
| 020 |
_a9783319912042 _9978-3-319-91204-2 |
||
| 024 | 7 |
_a10.1007/978-3-319-91204-2 _2doi |
|
| 050 | 4 | _aTK7867-7867.5 | |
| 072 | 7 |
_aTJFC _2bicssc |
|
| 072 | 7 |
_aTEC008010 _2bisacsh |
|
| 072 | 7 |
_aTJFC _2thema |
|
| 082 | 0 | 4 |
_a621.3815 _223 |
| 100 | 1 |
_aMrozek, Ireneusz. _eauthor. _4aut _4http://id.loc.gov/vocabulary/relators/aut _956569 |
|
| 245 | 1 | 0 |
_aMulti-run Memory Tests for Pattern Sensitive Faults _h[electronic resource] / _cby Ireneusz Mrozek. |
| 250 | _a1st ed. 2019. | ||
| 264 | 1 |
_aCham : _bSpringer International Publishing : _bImprint: Springer, _c2019. |
|
| 300 |
_aX, 135 p. 34 illus. _bonline resource. |
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| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_acomputer _bc _2rdamedia |
||
| 338 |
_aonline resource _bcr _2rdacarrier |
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| 347 |
_atext file _bPDF _2rda |
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| 505 | 0 | _aIntroduction to digital memory -- Basics of functional RAM testing -- Multi-cell faults -- Controlled random testing -- Multi-run tests based on background changing -- Multi-run tests based on address changing -- Multiple controlled random testing -- Pseudo exhaustive testing based on march tests -- Conclusion. | |
| 520 | _aThis book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory. The author discusses background selection and address reordering algorithms in multi-run transparent march testing processes. Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail. All methods presented ideas are verified by both analytical investigations and numerical simulations. Provides the first book related exclusively to the problem of multi-cell fault detection by multi-run tests in memory testing process; Presents practical algorithms for design and implementation of efficient multi-run tests; Demonstrates methods verified by analytical and experimental investigations. | ||
| 650 | 0 |
_aElectronic circuits. _919581 |
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| 650 | 0 |
_aMicroprocessors. _956570 |
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| 650 | 0 |
_aComputer architecture. _93513 |
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| 650 | 0 |
_aElectronics. _93425 |
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| 650 | 1 | 4 |
_aElectronic Circuits and Systems. _956571 |
| 650 | 2 | 4 |
_aProcessor Architectures. _956572 |
| 650 | 2 | 4 |
_aElectronics and Microelectronics, Instrumentation. _932249 |
| 710 | 2 |
_aSpringerLink (Online service) _956573 |
|
| 773 | 0 | _tSpringer Nature eBook | |
| 776 | 0 | 8 |
_iPrinted edition: _z9783319912035 |
| 776 | 0 | 8 |
_iPrinted edition: _z9783319912059 |
| 776 | 0 | 8 |
_iPrinted edition: _z9783030081980 |
| 856 | 4 | 0 | _uhttps://doi.org/10.1007/978-3-319-91204-2 |
| 912 | _aZDB-2-ENG | ||
| 912 | _aZDB-2-SXE | ||
| 942 | _cEBK | ||
| 999 |
_c79770 _d79770 |
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