000			03300nam a2200385 i 4500
001			CR9780511534829
003			UkCbUP
005			20230516164918.0
006			m|||||o||d||||||||
007			cr||||||||||||
008			090429s2000||||enk o ||1 0|eng|d
020			_a9780511534829 (ebook)
020			_z9780521554909 (hardback)
020			_z9780521031707 (paperback)
040			_aUkCbUP _beng _erda _cUkCbUP
050	0	0	_aQC611.98.H54 _bC43 2000
082	0	0	_a537.6/23/0284 _221
245	0	0	_aCharacterization of high Tc materials and devices by electron microscopy / _cedited by Nigel D. Browning, Stephen J. Pennycook.
246	3		_aCharacterization of High Tc Materials & Devices by Electron Microscopy
264		1	_aCambridge : _bCambridge University Press, _c2000.
300			_a1 online resource (xii, 391 pages) : _bdigital, PDF file(s).
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
500			_aTitle from publisher's bibliographic system (viewed on 05 Oct 2015).
505	0	0	_g1. _tHigh-resolution transmission electron microscopy / _rS. Horiuchi and L. He -- _g2. _tHolography in the transmission electron microscope / _rA. Tonomura -- _g3. _tMicroanalysis by scanning transmission electron microscopy / _rL.M. Brown and J. Yuan -- _g4. _tSpecimen preparation for transmission electron microscopy / _rJ.G. Wen -- _g5. _tLow-temperature scanning electron microscopy / _rR.P. Huebener -- _g6. _tScanning tunneling microscopy / _rM.E. Hawley -- _g7. _tIdentification of new superconducting compounds by electron microscopy / _rG. Van Tendeloo and T. Krekels -- _g8. _tValence band electron energy loss spectroscopy (EELS) of oxide superconductors / _rY.Y. Wang and V.P. Dravid.
520			_aThis is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.
650		0	_aHigh temperature superconductors. _915900
650		0	_aElectron microscopy _xTechnique. _968137
700	1		_aBrowning, Nigel D., _eeditor. _968138
700	1		_aPennycook, Stephen J., _eeditor. _968139
776	0	8	_iPrint version: _z9780521554909
856	4	0	_uhttps://doi.org/10.1017/CBO9780511534829
942			_cEBK
999			_c82256 _d82256