000			04920cam a2200577 i 4500
001			on1152528047
003			OCoLC
005			20230516165850.0
006			m o d
007			cr cnu---unuuu
008			200429s2020 ne o 001 0 eng d
040			_aOPELS _beng _erda _epn _cOPELS _dEBLCP _dOCLCF _dUKAHL _dUKMGB _dOCLCQ _dOCLCO _dCOM _dOCLCQ
015			_aGBC048794 _2bnb
016	7		_a019759468 _2Uk
020			_a9780128177877 _q(ePub ebook)
020			_a012817787X
020			_z9780128177860
020			_z0128177861
035			_a(OCoLC)1152528047
050		4	_aTK7875
082	0	4	_a621.381 _223
245	0	0	_aHandbook of silicon based mems materials and technologies / _cedited by Markku Tilli [and five others].
250			_aThird edition.
264		1	_aAmsterdam : _bElsevier, _c2020.
300			_a1 online resource
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
490	1		_aMicro and nano technologies series
500			_aIncludes index.
588	0		_aPrint version record.
505	0		_aFront Cover -- Handbook of Silicon Based MEMS Materials and Technologies -- Copyright Page -- Contents -- List of contributors -- Preface -- Where is silicon based MEMS heading to? -- References -- I. Silicon as MEMS Material -- 1 Properties of silicon -- 1.1 Properties of silicon -- 1.1.1 Crystallography of silicon -- 1.1.1.1 Miller index (hkl) system -- 1.1.1.2 Stereographic projection -- 1.1.2 Defects in silicon lattice -- 1.1.3 Mechanical properties of silicon -- 1.1.4 Electrical properties -- 1.1.4.1 Introduction-dopants and impurities in silicon
505	8		_a1.1.4.2 Piezoresistive effect in silicon -- General piezoresistive effect -- Strain -- Stress in anisotropic materials -- Strain effect on resistivity -- Linearity -- Effect of temperature and doping -- Example of a piezoresistive sensor design -- Surface effects -- References -- 2 Czochralski growth of silicon crystals -- 2.1 The Czochralski crystal-growing furnace -- 2.1.1 Crucible -- 2.1.2 Hot zone materials -- 2.1.3 Hot zone structure -- 2.1.4 Gas flow -- 2.2 Stages of growth process -- 2.2.1 Melting -- 2.2.2 Neck -- 2.2.3 Crown -- 2.2.4 Body -- 2.2.5 Tail -- 2.2.6 Shut-off
505	8		_a2.3 Selected issues of crystal growth -- 2.3.1 Diameter control -- 2.3.2 Doping -- 2.3.3 Hot zone lifetime -- 2.4 Improved thermal and gas-flow designs -- 2.5 Heat transfer -- 2.6 Melt convection -- 2.6.1 Free convection -- 2.6.2 Crucible rotation -- 2.6.3 Crystal rotation -- 2.6.4 Marangoni convection and gas shear -- 2.7 Magnetic fields -- 2.7.1 Cusp field -- 2.7.2 Transverse field -- 2.7.3 Melt flows under transverse field -- 2.7.4 Time-dependent fields -- 2.8 Hot recharging and continuous feed -- 2.8.1 Hot recharging -- 2.8.2 Charge topping -- 2.8.3 Crucible modifications
505	8		_a2.8.4 Continuous Czochralski growth -- 2.9 Heavily n-type doped silicon and constitutional supercooling -- 2.9.1 Constitutional supercooling -- 2.9.2 Melting-point depression -- 2.9.3 Origin of dopant gradient in the melt -- 2.9.4 Path to lower resistivity -- 2.10 Growth of large diameter crystals -- 2.10.1 Neck growth for large crystals -- 2.10.2 Neck extension -- 2.10.3 Additional stresses on neck -- 2.10.4 Dislocations oriented in (100) direction in large diameter crystals -- 2.10.5 Crucible wall temperature -- 2.10.6 Double-layered crucible structure -- 2.10.7 Crucible deformations
505	8		_a2.10.8 Intentional devitrification -- 2.10.9 Transverse or cusp field for very large crystals -- 2.10.10 Boosting crystal weight -- 2.10.11 Seed chuck -- 2.10.12 Additional challenges -- References -- Further reading -- 3 Properties of silicon crystals -- 3.1 Dopants and impurities -- 3.2 Typical impurity concentrations -- 3.3 Concentration of dopants and impurities in axial direction -- 3.4 Resistivity -- 3.5 Radial variation of impurities and resistivity -- 3.6 Thermal donors -- 3.7 Defects in silicon crystals
650		0	_aMicroelectromechanical systems. _96063
650		0	_aSilicon. _918548
650		2	_aMicro-Electrical-Mechanical Systems _0(DNLM)D055617 _968705
650		2	_aSilicon _0(DNLM)D012825 _918548
650		6	_aMicrosyst�emes �electrom�ecaniques. _0(CaQQLa)201-0327119 _968706
650		6	_aSilicium. _0(CaQQLa)201-0052755 _968707
650		7	_asilicon. _2aat _0(CStmoGRI)aat300011769 _918548
650		7	_aMicroelectromechanical systems. _2fast _0(OCoLC)fst01019745 _96063
650		7	_aSilicon. _2fast _0(OCoLC)fst01118631 _918548
700	1		_aTilli, Markku, _eeditor. _968708
776	0	8	_iPrint version: _tHandbook of silicon based mems materials and technologies. _bThird edition. _dAmsterdam : Elsevier, 2020 _z9780128177860 _w(OCoLC)1151986311
830		0	_aMicro & nano technologies. _968709
856	4	0	_3ScienceDirect _uhttps://www.sciencedirect.com/science/book/9780128177860
942			_cEBK
999			_c82431 _d82431