000			04762cam a2200565 a 4500
001			on1155316088
003			OCoLC
005			20230516165852.0
006			m o d
007			cr |n|||||||||
008			200525s2020 enk o 001 0 eng d
040			_aYDX _beng _epn _cYDX _dOPELS _dUKAHL _dN$T _dOCLCF _dUKMGB _dEBLCP _dOCLCQ _dOCLCO _dSFB _dOCLCQ
015			_aGBC065594 _2bnb
016	7		_a019806793 _2Uk
019			_a1156140815
020			_a9780081028032 _q(electronic bk.)
020			_a0081028032 _q(electronic bk.)
020			_z9780128172469
020			_z0128172460
035			_a(OCoLC)1155316088 _z(OCoLC)1156140815
050		4	_aTA418.5
082	0	4	_a620.1/12 _223
100	1		_aCho, Yasuo. _968739
245	1	0	_aScanning nonlinear dielectric microscopy : _binvestigation of ferroelectric, dielectric, and semiconductor materials and devices / _cYasuo Cho.
260			_aDuxford : _bWoodhead Publishing, _c2020.
300			_a1 online resource
336			_atext _btxt _2rdacontent
336			_astill image _bsti _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
490	1		_aWoodhead Publishing Series in Electronic and Optical Materials
500			_aIncludes index.
505	0		_aFront Cover -- Scanning Nonlinear Dielectric Microscopy -- Copyright Page -- Contents -- Preface -- 1 Principles of scanning nonlinear dielectric microscopy for measuring ferroelectric and dielectric materials -- 1.1 Basic theory -- 1.1.1 Macroscopic phenomenological definition of linear and nonlinear dielectric constants -- 1.1.2 Capacitance variation with alternating electric field -- 1.2 System setup of scanning nonlinear dielectric microscopy -- 1.3 Theory for nonlinear dielectric imaging -- 1.3.1 General theorem for capacitance variation under applied electric field
505	8		_a1.3.2 Theoretical calculation for scanning nonlinear dielectric microscopy image -- 1.4 Higher-order scanning nonlinear dielectric microscopy -- 1.4.1 Theory -- 1.4.2 Theoretical one-dimensional image and depth sensitivity of higher-order scanning nonlinear dielectric microscopy -- References -- 2 Ferroelectric polarization measurement -- 2.1 Analysis of distributions of ferroelectric domains on a microscopic scale using scanning nonlinear dielectric microscopy -- 2.2 Higher-order nonlinear dielectric analyses -- References -- 3 Three-dimensional polarization measurement
505	8		_a3.1 Basics of three-dimensional polarization distribution assessment -- 3.2 Principles of three-dimensional polarization assessment using scanning nonlinear dielectric microscopy -- 3.3 Lateral assessment by Kelvin force microscopy with electric field correction -- 3.4 Lateral nanoscale assessment with electric field correction -- References -- 4 Ultrahigh-density ferroelectric data storage using scanning nonlinear dielectric microscopy -- 4.1 Ferroelectric probe memory based on scanning nonlinear dielectric microscopy with a linear scanning stage
505	8		_a4.1.1 Scanning nonlinear dielectric microscopy with a linear scanning stage for ultrahigh-density ferroelectric data storage -- 4.1.2 Analysis of nanodomain dots in congruent single-crystal LiTaO3 -- 4.1.3 Manipulating nanodomains using scanning nonlinear dielectric microscopy with a linear scanning stage -- 4.2 Hard-disk-drive-type scanning nonlinear dielectric microscopy ferroelectric probe memory -- 4.2.1 Background on development of ultrahigh-density hard-disk-drive-type scanning nonlinear dielectric microscopy ferroele ...
505	8		_a4.2.2 An scanning nonlinear dielectric microscopy ferroelectric data storage system having an hard disk drive format -- 4.2.3 Ferroelectric recording media for scanning nonlinear dielectric microscopy probe memory having an hard disk drive format -- 4.2.4 Rapid R/W characteristics of an scanning nonlinear dielectric microscopy data storage system -- 4.2.5 An hard disk drive scanning nonlinear dielectric microscopy data storage unit for high-density ferroelectric recording
650		0	_aMaterials _xAnalysis. _96593
650		0	_aMicroscopy. _914697
650		2	_aMicroscopy _0(DNLM)D008853 _914697
650		6	_aMat�eriaux _xAnalyse. _0(CaQQLa)201-0297100 _968740
650		6	_aMicroscopie. _0(CaQQLa)201-0055735 _968741
650		7	_amicroscopy. _2aat _0(CStmoGRI)aat300054100 _914697
650		7	_aMaterials _xAnalysis. _2fast _0(OCoLC)fst01011773 _96593
650		7	_aMicroscopy. _2fast _0(OCoLC)fst01020062 _914697
776	0	8	_iPrint version: _z0128172460 _z9780128172469 _w(OCoLC)1127934545
830		0	_aWoodhead Publishing series in electronic and optical materials. _968742
856	4	0	_3ScienceDirect _uhttps://www.sciencedirect.com/science/book/9780128172469
942			_cEBK
999			_c82441 _d82441