000 02318cam a2200493 i 4500
001 on1259660956
003 OCoLC
005 20230516165939.0
006 m o d
007 cr |n|||||||||
008 210712s2021 enk o 000 0 eng d
040 _aYDX
_beng
_erda
_epn
_cYDX
_dOPELS
_dOCLCO
_dN$T
_dUKAHL
_dGZM
_dOCLCF
_dUKMGB
_dNLW
_dOCLCQ
_dOCLCO
_dK6U
_dOCLCQ
015 _aGBC1D9388
_2bnb
016 7 _a020287985
_2Uk
020 _a9780128236444
_q(electronic bk.)
020 _a0128236442
_q(electronic bk.)
020 _z9780128235188
035 _a(OCoLC)1259660956
050 4 _aQC451
072 7 _aTEC
_x008000
_2bisacsh
072 7 _aTJFD
_2bicssc
082 0 4 _a543.5
_223
100 1 _aPoplavko, �I�U. M.
_q(�I�Uri�i Mikha�ilovich)
_968575
245 1 0 _aDielectric spectroscopy of electronic materials :
_bapplied physics of dielectrics /
_cYuriy Poplavko.
264 1 _aDuxford :
_bWoodhead Publishing,
_c2021.
300 _a1 online resource
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
490 1 _aWoodhead Publishing series in electronic and optical materials
505 0 _a1. The basics of dielectric spectroscopy; 2. Broadband dielectric spectroscopy; 3. Polarization mechanisms described by oscillator model; 4. Polarization mechanisms described by relaxation model; 5. Microwave methods large permittivity measurements; 6. Selected examples of various solids spectroscopy; 7. Selected examples of ferroelectrics dielectric spectra
650 0 _aSpectrum analysis.
_911993
650 0 _aDielectric measurements.
_969382
650 0 _aElectronics
_xMaterials.
_98018
650 6 _aMesures di�electriques.
_0(CaQQLa)201-0091439
_969383
650 6 _a�Electronique
_xMat�eriaux.
_0(CaQQLa)201-0016374
_968419
650 7 _aDielectric measurements.
_2fast
_0(OCoLC)fst00893113
_969382
650 7 _aElectronics
_xMaterials.
_2fast
_0(OCoLC)fst00907562
_98018
650 7 _aSpectrum analysis.
_2fast
_0(OCoLC)fst01129108
_911993
776 0 8 _iPrint version:
_z0128235187
_z9780128235188
_w(OCoLC)1226564524
830 0 _aWoodhead Publishing series in electronic and optical materials.
_969384
856 4 0 _3ScienceDirect
_uhttps://www.sciencedirect.com/science/book/9780128235188
942 _cEBK
999 _c82589
_d82589