System-on-Chip Test Architectures Nanometer Design for Testability
By: Wang, Laung, Terng | Stroud, Charles, E | Touba, Nur, A.
Material type:
BookPublisher: Amsterdam Elsevier 2008Description: xxxvi+856p.,24X19Cms.ISBN: 9780123739735.DDC classification: 621.395 W246
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
Books
|
CENTRAL LIBRARY | 621.395 W246 (Browse shelf) | Available | 080602 | |
|
Books
|
CENTRAL LIBRARY | 621.395 W246 (Browse shelf) | Available | 080171 | |
|
Books
|
CENTRAL LIBRARY | 621.395 W246 (Browse shelf) | Available | 079047 |
There are no comments for this item.